Abstract
On-line studies of surface topographical development have been made by mounting a saddle-field ion source into a standard scanning electron microscope. Preliminary results obtained during operation in both dynamic and static modes are presented.
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Lewis, G.W., Colligon, J.S. & Nobes, M.J. Dynamic study of ion etching in a high resolution SEM. J Mater Sci 15, 681–684 (1980). https://doi.org/10.1007/BF00551734
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DOI: https://doi.org/10.1007/BF00551734