Abstract
Anodic films on Nb were found to have the expected amorphous structure for all formation voltages starting at 6 volts. Films on V, Ta, Mo, and W, on the other hand, were amorphous only when thick, with films below 9 to 30 nm (6 to 10 volts) showing a polycrystalline pattern by reflection electron diffraction. Although the patterns of the thin films were difficult to identify because of their poor quality, the following assignments are proposed: not V2O5, TaO z plus δ — Ta — O, MoO2 · H2O, WO2. To get information on the stoichiometry of thick anodic films on V, Mo, and W, specimens were crystallized by heating them at 300 to 500° C in air, but it was shown that the resulting observation of V2O5, MoO3, and WO3 has no relevance, as oxidation is both thermodynamically and kinetically possible. Vacuum crystallization was shown to be quite unsatisfactory with V and Mo, though is possibly acceptable with W; the information obtained from a comparison of film weights with metal-removal weights, namely that the stoichiometries were close to V2O5, MoO3, and WO3, is more relevant. The stoichiometries TaO z , MoO2 · H2O, and WO2 in the thin films are thermodynamically understandable. A greater problem arises in explaining the state of crystallinity of these as well as other anodic films. A parallel is proposed between anodic and ion-bombarded oxides, for in both cases the state of crystallinity tends to be the same and, furthermore, correlates with the ratio (crystallization temperature)/(melting temperature). A model based on crystallization due to energy deposition is discussed.
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Arora, M.R., Kelly, R. The structure and stoichiometry of anodic films on V, Nb, Ta, Mo and W. J Mater Sci 12, 1673–1684 (1977). https://doi.org/10.1007/BF00542819
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DOI: https://doi.org/10.1007/BF00542819