Zusammenfassung
Das Trägergemisch bewirkt eine Erhöhung der Verdampfungsgeschwindigkeit der zu bestimmenden Elemente und der Anzahl der Atome im Bogenplasma. Es verbessert mehr als andere Träger die Empfindlichkeit und ermöglicht die Bestimmung von Mikromengen der Elemente (Mg, Ca, Mn, Co, Fe, Pb, Cu, Cd, Al, B, Sn, As, Bi) in hochreinem Yttriumoxid mit Nachweisgrenzen von 0,1–13 ppm. Die Variationskoeffizienten liegen unter 20%.
Summary
An emission-spectrometric method is described for the quantitative determination of traces of non-rare earth elements in yttrium oxide, employing addition of AgF-Ga2O3 mixed carrier. This addition effects an increase of the rate of evaporation of the analytical elements and of the number of atoms in the arc plasma. It enhances the sensitivity of the analytical elements to a larger extent than other carriers and permits the determination of microquantities of the elements (Mg, Ca, Mn, Co, Fe, Pb, Cu, Cd, Al, B, Sn, As, Bi) within limits of detection from 0.1 to 13 ppm in high-purity yttrium oxide. The coefficients of variation are less than 20%.
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Osumi, Y., Kato, A. & Miyake, Y. Emission-spectrometric determination of trace non-rare earth elements in yttrium oxide using AgF-Ga2O3 mixed carrier. Z. Anal. Chem. 255, 103–109 (1971). https://doi.org/10.1007/BF00424442
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DOI: https://doi.org/10.1007/BF00424442