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Ultrafast beam-deflection method and its application for measuring the transient refractive index of materials

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Abstract

We represent an ultrafast beam-deflection method as a simple and powerful tool for the time-resolved measurement of induced changes of the refractive index in the order of Δn=10−5. The method is applied for measuring the changes of components of the refractive index parallel and perpendicular to the pump-pulse polarization on a femtosecond time scale. Fused silica and CS2 are used as samples for demonstrating our method.

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Authors and Affiliations

  1. Institut für Optik and Quantenelektronik, Friedrich-Schiller-Universität Jena, Max-Wien-Platz 1, D-07743, Jena, Germany

    H.-S. Albrecht & D. V. Lap

  2. Max-Planck-Arbeitsgruppe “Röntgenoptik”, Friedrich-Schiller-Universität Jena, Max-Wien-Platz 1, D-07743, Jena, Germany

    P. Heist

  3. Lambda Physik GmbH, Hans-Böckler-Strasse 12, D-37079, Göttingen, Germany

    J. Kleinschmidt

Authors
  1. H.-S. Albrecht
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  2. P. Heist
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  3. J. Kleinschmidt
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  4. D. V. Lap
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Albrecht, HS., Heist, P., Kleinschmidt, J. et al. Ultrafast beam-deflection method and its application for measuring the transient refractive index of materials. Appl. Phys. B 57, 193–197 (1993). https://doi.org/10.1007/BF00334534

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  • DOI: https://doi.org/10.1007/BF00334534

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