Abstract
A new method for the investigation of ultrasonic waves on surfaces of solids based on scanning tunneling microscopy is presented. A sinusoidal high frequency signal is added to the tip voltage. Hence the tunneling current contains a component whose frequency is the difference of the frequencies of the acoustic wave field and the ac tip voltage. Amplitude and phase of this component carry the full information about the wave field.
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References
J.P. Monchalin: IEEE Trans. UFFC-33, 5, 485 (1986)
H. Cerva, W. Graeff: Phys. Status Solidi A 82, 35 (1984)
H.P. Feuerbaum, H.P. Grassl, U. Knauer, R. Veith: Scanning Electron Microsc. (USA) 1, 55 (1983)
J. Heil, J. Wesner, W. Grill: J. Appl. Phys. 64, 4 (1988)
E. Chilla, H.-J. Fröhlich, J. Riedel, W. Rohrbeck: Proc. “8. Tagung Akustik/11. Winterschule Mikroakustik” 212 (1989), Phys. Gesellschaft d. DDR, Berlin 1989
W. Rohrbeck, E. Chilla, J. Riedel, H.-J. Fröhlich: Beitr. elektronenmikroskop. Direktabb. Oberfl. 23, 319 (1990)
P.K. Hansma, J. Tersoff: J. Appl. Phys. 61, R1 (1987)
G. Binnig, H. Rohrer, Ch. Gerber, E. Weibel: Appl. Phys. Lett. 40, 178 (1982)
G. Binnig, H. Rohrer: IBM J. Res. Develop. 30, 355 (1986)
K. Dransfeld: Private communication