Abstract
X-ray and neutron reflectivity measurements provide a wealth of information on thickness and interfacial properties on the nanometer scale. This method is therefore well suited for the study of nano-structured thin films and superlattices. Neutrons provide a different contrast between the elements than X-rays and, in addition, are sensitive to the magnetization in the sample. Using polarized neutrons, magnetic as well as chemical profiles can be probed. In this review a basic introduction into the theory of X-ray and neutron reflectivity is provided along with some recent examples including the oxidation of Fe films and the structural and magnetic properties of Co/Cu superlattices.
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