Summary
Surface morphology and molecular arrangement have been recorded by atomic force microscopy (AFM) on polytetrafluoroethylene (PTFE) and on polycarbonate (PC) films. In a thin layer of PTFE deposited by rubbing polymer on hot glass substrate unidirectional orientation of polymer has been revealed. Individual polymer chains have been visualized. An interchain distance of .53 nm and several periodicities along the chain contours have been found-.44 nm, .62 nm and .82 nm-in accordance with a 13/6 helix.
The monitoring of surface changes during thermal treatment of amorphous-bis-phenol A-PC film has been realized by AFM. Different types of surface morphology were revealed. Spherulites are formed during polymer crystallization. In most cases, however, numerous nanocrystallites appeared after thermal treatment. On their surfaces well-ordered atomic scale AFM images have been received. The arrangement of AFM patterns can be characterized by periodicities of .50 nm and .52 nm in the orthogonal directions. Polycarbonate oligomers-as the product of surface degradation-effectively might form the observed nanocrystallites.
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Prof. Dr. G. Zachmann zum 60. Geburtstag herzlichst gewidmet
These results were given by us first in a lecture in Baltimore, at the 5th ISPAC Symposium on May 31, 1991, and in a lecture in Santa Barbara, at the Nanoscope Users Meeting on June 25, 1991
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Magonov, S.N., Kempf, S., Kimmig, M. et al. Atomic force microscopy on polymers and polymer related compounds. Polymer Bulletin 26, 715–722 (1991). https://doi.org/10.1007/BF00313229
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DOI: https://doi.org/10.1007/BF00313229