Abstract
We compare the inelastic scattering rate in 220-Å-thick free-standing films with nearly identical films on substrates. The scattering rate was determined by fitting the magnetoresistance to theories of quantum transport. Although the films are sufficiently thin so as to modify the three-dimensional spectrum of thermal phonons, we find no significant difference between the scattering rates in free-standing and supported films. While experiments on other materials down to lower temperatures are necessary, we conclude that the cubic temperature dependence of the inelastic scattering rate in these thin aluminum films is not strongly affected by the phonon dimensionality.
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Kwong, Y.K., Lin, K., Isaacson, M.S. et al. An attempt to observe phonon dimensionality crossover effects in the inelastic scattering rate of thin free-standing aluminum films. J Low Temp Phys 88, 261–272 (1992). https://doi.org/10.1007/BF00162961
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DOI: https://doi.org/10.1007/BF00162961