Summary
A method has been developed to screen onion and leek seedlings under controlled conditions for resistance to white rot.
Considerable differences in resistance were found between cultivars of onions and leek respectively. The highest resistance levels were observed in the onion cultivars Beth Alpha and Pukekohe Longkeeper and in the leek cultivars Batina, Carentan and Elephant.
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References
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van der Meer, Q.P., van Bennekom, J.L. & van der Giessen, A.C. Screening for resistance to white rot caused by Sclerotium cepivorum Berk. in onions (Allium cepa L.) and leeks (Allium porrum L.). Euphytica 32, 697–701 (1983). https://doi.org/10.1007/BF00042149
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DOI: https://doi.org/10.1007/BF00042149