Selection for resistance to Septoria nodorum in wheat

Summary

A population of 572 F₂ derived F₃ lines from six crosses were used to estimate parameters relevant to selection for resistance to Septoria nodorum of wheat. Lines were grown in disease free (fungicide sprayed) and inoculated microplots in 2 replications of a split-plot design in a single environment in 1977. Average yield reduction due to disease was approximately 50%; this was associated with an average septoria score of 50% on the flag leaf, an average septoria score of 42% on the head, and a reduction of 37% in seed weight. Low S. nodorum scores were correlated with late heading date, tall plant height, high grain yield, and high seed weight in diseased plots, and high seed weight % (seed weight in diseased plots expressed as a percentage of seed weight in fungicide sprayed plots).

Restricted selection indexes were used to study the relative contributions of disease escape, true resistance, and tolerance to variability in grain yield in diseased plots, seed weight in diseased plots, and seed weight %. True resistance appeared to be the most important factor causing variation in grain yield in diseased plots and seed weight %. Tolerance and escape seemed to be more important for seed weight in diseased plots.

Heritabilities of S. nodorum scores on the flag leaf and head were 63% and 52%, respectively. Leaf and head scores could be used most effectively as selection criteria to upgrade resistance in a population before harvest.

Selection for high seed weight % slightly reduced yields in disease free plots, although yield in diseased plots and seed weight in diseased plots were increased. However, selection for increased yield or increased seed weight in diseased plots improved yield in disease free plots. It is suggested that direct selection for yield or seed weight in diseased plots is likely to achieve more desirable goals than selection for seed weight %.