Abstract
E-mode AlGaN/GaN high electron mobility transistors have been investigated over its DC and RF performance. The effect of adding an additional barrier layer of AlxGa1−xN with a different mole fraction of Al in the two layers has been reported. Simulation results indicate an enhancement in the peak transconductance as well as in the ft and fmax values as compared to the single-barrier layer E-mode HEMT, thereby indicating an improvement in the DC and RF characteristics resulting from the barrier layer engineering of the device.
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References
U. Mishra, P. Parikh, Y.-F. Wu, AlGaN/GaN HEMTs-an overview of device operation and applications. Proc. IEEE 90(6), 1022–1031 (2002)
G. Tang et al., Digital integrated circuits on an E-Mode GaN power HEMT platform. IEEE Electron. Device Lett. 38(9), 1282–1285 (2017)
K.J. Chen, O. Häberlen, A. Lidow, C.L. Tsai, T. Ueda, Y. Uemoto, Y. Wu, GaN-on-Si power technology: devices and applications. IEEE Trans. Electron. Devices 64(3), 779–795 (2017)
O. Ambacher, B. Foutz, J. Smart, J.R. Shealy, N.G. Weimann, K. Chu, M. Murphy, A.J. Sierakowski, W.J. Schaff, L.F. Eastman, J. Appl. Phys. 87, 334 (2000)
K. Köhler, S. Müller, P. Waltereit, W. Pletschen, V. Polyakov et al., J. Appl. Phys. 109, 053705 (2011). https://doi.org/10.1063/1.3553866
S. Majumdar, S. Das, D. Biswas, Barrier layer engineering: performance evaluation of E-mode InGaN/AlGaN/GaN HEMT. 1675 (2015). https://doi.org/10.1063/1.4929179
S. Turuvekere, A. Dasgupta, N. DasGupta, Effect of barrier layer thickness on gate leakage current in AlGaN/GaN HEMTs. IEEE Trans. Electron. Devices 62, 3449–3452 (2015). https://doi.org/10.1109/ted.2015.2469151
U.K. Mishra, L. Shen, T.E. Kazior, Y. Wu, GaN-based RF power devices and amplifiers. Proc. IEEE 96, 287 (2008)
H.F. Huang et al., Investigation of a GaN-on-Si HEMT optimized for the 5th-generation wireless communication, in 2015 IEEE 11th International Conference on ASIC (ASICON), Chengdu (2015), pp. 1–4
C. Tang, J. Shi, Influence of acceptor-like traps in the buffer on current collapse and leakage of E-mode AlGaN/GaN MISHFETs. Semicond. Sci. Technol. 28, 5011– (2013). https://doi.org/10.1088/0268-1242/28/11/115011
Y. Yingxia, Z. Lin, C. Luan, Y. Lv, Z. Feng, M. Yang, Y. Wang, H. Chen, Influence of the channel electric field distribution on the polarization Coulomb field scattering in AlGaN/AlN/GaN heterostructure field-effect transistors. AIP Adv. 3, 092115 (2013). https://doi.org/10.1063/1.4821547
YvonCordier, Al(Ga)N/GaN high electron mobility transistors on silicon. Phys. Status Solidi A 212(5), 1049–1058 (2015)
D. Marti, S. Tirelli, V. Teppati, L. Lugani, J.-F. Carlin, M. Malinverni, N. Grandjean, C.R. Bolognesi, IEEE Electron. Device Lett. 36, 17 (2015)
A.D. Bykhovski, B.L. Gelmont, M.S. Shur, Elastic strain relaxation and piezoeffect in GaN-AlN, GaN-AlGaN and GaN-InGaNsuperlattices. J. Appl. Phys. 81(9), 6332–6338 (1997)
K.H. Teo, J. Shi, Simulation of GaN HEMT with wide-linear-range transconductance, TR2017-152 October 2017 (Mitsubishi Electric Research Laboratories, 2007)
I. Khalil, E.B. Treidel, F. Schnieder, J. Würfl, Improving the linearity of GaN HEMTs by optimizing epitaxial structure. IEEE Trans. Electron. Devices 56(3), 361–364 (2009)
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Mondal, S., Paul, S., Sarkar, A. (2018). Investigation of the Effect of Barrier Layer Engineering on DC and RF Performance of Gate-Recessed AlGaN/GaN HEMT. In: Mandal, J., Mukhopadhyay, S., Dutta, P., Dasgupta, K. (eds) Methodologies and Application Issues of Contemporary Computing Framework. Springer, Singapore. https://doi.org/10.1007/978-981-13-2345-4_14
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