Abstract
Topography affects electromagnetic data and leads to wrong interpretation of shallow resistivity layers. In this paper, we propose a new method for correcting topographic error in electromagnetic data. In order to achieve this, we used a small DC configuration to obtain the surface resistivity, and then used the surface resistivity to construct a new topographic correction formula. Both synthetic and field TEM and CSAMT data were processed using this method. The results show that our method is a fast, effective and practical tool for correcting topographic effects in electromagnetic data.
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Xue, G., Chen, W., Cui, J., Yan, S. (2017). A Fast Topographic Correction Method for TEM Data. In: Di, Q., Xue, G., Xia, J. (eds) Technology and Application of Environmental and Engineering Geophysics. Springer Geophysics. Springer, Singapore. https://doi.org/10.1007/978-981-10-3244-8_15
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DOI: https://doi.org/10.1007/978-981-10-3244-8_15
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