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Sensors for Scanning Probe Microscopy

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Micro/Nanotribology and Its Applications

Part of the book series: NATO ASI Series ((NSSE,volume 330))

Abstract

On the nanometer scale or the molecular level the boundaries between physics, chemistry, biology, medical and engineering science seem to disappear and all the disciplines have a common center of research. A deeper knowledge of the life-processes in biology a more detailed understanding in chemistry, medical science and genetics as well as of the growth of novel materials and its characterization in material science demands tools with highest — in particular cases atomic — lateral resolution.

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Author information

Authors and Affiliations

  1. Institut für Technische Physik, Universität Kassel, 34132, Kassel, Germany

    Rainer Kassing & Egbert Oesterschulze

Authors
  1. Rainer Kassing
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  2. Egbert Oesterschulze
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Editor information

Editors and Affiliations

  1. Computer Microtribology and Contamination Laboratory, Department of Mechanical Engineering, The Ohio State University, Columbus, Ohio, USA

    Bharat Bhushan (Ohio Eminent Scholar Professor, Director) (Ohio Eminent Scholar Professor, Director)

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© 1997 Springer Science+Business Media Dordrecht

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Kassing, R., Oesterschulze, E. (1997). Sensors for Scanning Probe Microscopy. In: Bhushan, B. (eds) Micro/Nanotribology and Its Applications. NATO ASI Series, vol 330. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-5646-2_3

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  • DOI: https://doi.org/10.1007/978-94-011-5646-2_3

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-6381-4

  • Online ISBN: 978-94-011-5646-2

  • eBook Packages: Springer Book Archive

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