Abstract
Thin organic films, such as Langmuir-Blodgett (LB) films and vapor-deposited organic thin films, have been studied in our laboratory by various scanning probe microscopies (SPM) such as atomic force microscopy (AFM), friction force microscopy (FFM), scanning surface potential microscopy (SSPM), scanning near-field optical/atomic force microscopy (SNOAM), and scanning near-field optical fluorescence microscopy (SNOFM) and spectroscopy (SNOFS). These techniques can be used not only to characterize the thin films, but also to manipulate molecules in the films and to drive the molecular devices made of the thin films.
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Fujihira, M. (1995). Study of Thin Organic Films by Various Scanning Force Microscopes. In: Güntherodt, H.J., Anselmetti, D., Meyer, E. (eds) Forces in Scanning Probe Methods. NATO ASI Series, vol 286. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-0049-6_54
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DOI: https://doi.org/10.1007/978-94-011-0049-6_54
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