Abstract
We demonstrate the ability of state of the art multichannel photon detectors such as the cooled silicon intensified target vidicon and the microchannel plate photomultiplier with a position sensitive resistive anode to detect Raman scattering from weakly scattering, transparent thin films, reacted metallic, layers and disordered surface layers. Vibrational spectra have been obtained for surface layers as thin as 10 A, for frequency shifts as small as 80 cm-1 and for substrates which produce background emission orders of magnitude larger than the Raman emission from the surface layer. Measurements of the Raman spectra of thermally grown SiO2 layers on crystalline Si show that signals from systems with a Raman scattering efficiency below 10-15 can be detected in the presence of the strong second order Raman scattering of Si. Since the Raman efficiency of a monolayer of nitrobenzene is about 10-15, this shows we now have the ability to use Raman scattering to study the behavior of adsorbates and surface layers, independent of the identity of the substrate.
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References
J. E. Demuth and Ph. Avouris, Physics Today 36, no. 11, 62 (1983).
R. G. Greenler and T. L. Slager, Spectrochimica Acta A29, 193 (1973).
M. Udegawa, C. C. Chou, J. C. Hemminger and S. Ushioda, Phys. Rev. B23, 6843 (1981).
Surface Enhanced Raman Scattering ed. by R. K. Chang and T. E Furtak (Plenum Press, New York 1982).
J. E. Rowe, C. V. Shank, D. A. Zwemer and C. A. Murray, Phys. Rev. Lett. 44, 1770 (1980).
P. B. Dorain, K. U. von Raben, R. K. Chang and B. L. Laube, Chem. Phys. Lett. 84, 405 (1981).
D. P. Jeanmaire and R. P. Van Duyne, J. Electroanal. Chem. 84, 1 (1977).
J. C. Tsang and J. R. Kirtley, Solid State Commun. 30, 617 (1979).
A. Campion, J. K. Brown and V. M. Grizzle, Surf. Sci. 115 L153 (1982).
J. C. Tsang, Ph. Avouris and J. R. Kirtley, J. Chem. Phys. 79, 493 (1983).
F. W. King, R. P. VanDuyne and G. C. Schatz, J. Chem. Phys. 69, 4472 (1978).
S. S. Jha, J. R. Kirtley and J. C. Tsang, Phys. Rev. B. 22, 3973 (1980).
A. Otto, Surf. Sci. 92, 145 (1980).
R. K. Chang and M. B. Long in Topics in Applied Physics- Light Scattering in Solids II ed. by M. Cardona and G. Guntherodt ( Springer, Berlin 1982 ).
D. Rees, I. McWhirter, P. A. Rounce and F. E. Barlow J. Phys. E: Sci. Instrum. 14, 229 (1981).
C. Firmani, E. Ruiz, C. W. Carlson, M. Lampton and F. Paresce, Rev. Sci. Instrum. 53, 570 (1982).
R. J. Nemanich, C. C. Tsai and G. A. N. Connell, Phys. Rev. Lett. 44, 273 (1980).
R. J. Dornhaus, M. B. Long, R. E. Brenner and R. K. Chang, Surf. Sci. 93, 240 (1980).
F. J. Grunthaner, P. J. Grunthaner, R. P. Vasquez, B. F. Lewis and J. Maserjian, J. Vac. Sci. Technol. 16, 1443 (1979).
N. Wada and S. A. Solin, Physica 105B, 353 (1981).
P. E. Schoen and H. Z. Cummins in Light Scattering in Solid, ed. by M. Balkanski (Flammarion, Paris 1971).
R. P. Van Duyne in Chemical and Biological Applications of Lasers, ed. by C. B. Moore (Academic Press, New York 1979).
F. L. Galeener and J. C. Mikkelson, Solid State Commun. 36, 983 (1980)
R. M. Martin and F. L. Galeener, Phys. Rev. B23, 3071 (1981).
R. Loudon, Advances in Phys. 13, 423 (1964).
M. Cardona in Topics in Applied Physics-Light Scattering in Solids II ed. by M. Cardona and G. Guntherodt (Springer, Berlin 1982).
M. A. Renucci, J. B. Renucci, R. Zeyher and M. Cardona, Phys. Rev. B10, 4309 (1974).
J. B. Renucci, R. N. Tyte and M. Cardona, Phys. Rev. B11, 3885 (1975).
F. L. Galeener, A. J. Leadbetter and M. W. Stringfellow, Phys. Rev. B27, 1052 (1983).
J. C. Tsang, Y. Yokota, R. Matz and G. Rubloff, Appl. Phys. Lett. 44, 430 (1984).
R. J. Nemanich, T. W. Sigmon, N. M. Johnson, M. D. Moyer and S. S. Lau, in Laser and Electron-Beam Solid Interactions and Materials Processing ed. by J. F. Gibbons, L. D. Hess and T. W. Sigmon (North Holland, New York, 1981), p. 541.
R. Matz, R. J. Purtell, Y. Yokota, G. W. Rubloff and P. Ho, J. Vac. Sci. Technol. (to be published).
R. Shuker and R. W. Gammon, Phys. Rev. Lett. 25, 222 (1970).
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Tsang, J.C. (1984). Raman Spectroscopy of Thin Films on Semiconductors. In: Pullman, B., Jortner, J., Nitzan, A., Gerber, B. (eds) Dynamics on Surfaces. The Jerusalem Symposia on Quantum Chemistry and Biochemistry, vol 17. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-5237-9_28
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DOI: https://doi.org/10.1007/978-94-009-5237-9_28
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