Abstract
The transmission properties of samples or optical components may be represented by a 4x4 matrix which converts the Stokes vector of the incoming radiation to the Stokes vector of the transmitted radiation. Polarization modulation spectroscopy permits the observation of all the important optical elements. Measurement of the DC light intensity together with measurements at the modulation frequency and its first overtone provide the means for the selective measurement of different columns of the Mueller matrix of the sample. Rows are selected with auxiliary polarizers and retarders. In simple cases this permits the direct observation of linear dichroism, circular dichroism, optical rotation, linear birefringence, etc. In complex cases the observed matrix elements are complicated functions of all optical effects. Methods are discussed for the design of experiments for both the simple and complex optical systems, together with a discussion of the analysis of polarized light and the way in which the optical anisotropies of the instrument interact with those of the sample under investigation.
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This paper is dedicated to the memory of James Kemp, whose photoelastic modulator contributed so much to the research presented at this conference.
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© 1988 Kluwer Academic Publishers
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Schellman, J.A. (1988). Polarization Modulation Spectroscopy. In: Samori’, B., Thulstrup, E.W. (eds) Polarized Spectroscopy of Ordered Systems. NATO ASI Series, vol 242. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-3039-1_11
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DOI: https://doi.org/10.1007/978-94-009-3039-1_11
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