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Analytical Techniques for Atmospheric Trace Elements

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Control and Fate of Atmospheric Trace Metals

Part of the book series: NATO ASI Series ((ASIC,volume 268))

Abstract

Six analytical techniques for measuring trace elements in atmospheric aerosols and deposition samples are presented. These techniques are neutron activation analysis (NAA), X-ray fluorescence (XRF), particle-induced X-ray emission analysis (PIXE), atomic absorption spectrometry (AAS), inductively coupled plasma atomic emission spectrometry (ICP-AES) and inductively coupled plasma mass spectrometry (ICP-MS). The principles, instrumentation and methodological aspects (e.g., calibration, matrix effects, sensitivity, accuracy) of each technique are discussed, and the preparation of atmospheric aerosol samples and of deposition samples for analysis is described. The relative advantages and disadvantages of the various techniques are discussed to some extent. Collection procedures for atmospheric particulate matter and for dry and wet deposition are also briefly described.

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  1. Instituut voor Nucleaire Wetenschappen, Rijksuniversiteit Gent, Proeftuinstraat 86, B-9000, Gent, Belgium

    Willy Maenhaut

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  1. Norwegian Institute for Air Research, P.O. Box 64, N-2001, Lillestrøm, Norway

    Jozef M. Pacyna  & Brynjulf Ottar  & 

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Maenhaut, W. (1989). Analytical Techniques for Atmospheric Trace Elements. In: Pacyna, J.M., Ottar, B. (eds) Control and Fate of Atmospheric Trace Metals. NATO ASI Series, vol 268. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-2315-7_12

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  • DOI: https://doi.org/10.1007/978-94-009-2315-7_12

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