Abstract
Spatial resolution is important for any microscopy. This chapter presents the theory, technique, and examples of achieving the ultimate resolution of a transmission electron microscope with the method of “high-resolution transmission electron microscopy.” Recall (Sect. 2.3.3) that the HRTEM image is an interference pattern between the forward-scattered and diffracted electron waves from the specimen. Interference patterns require close attention to the phases of the waves. While the ray optics approach is useful for a few geometrical arguments, the most important issues in HRTEM are best understood in terms of the phase of the electron wavefront and how this phase is altered by the specimen and by the objective lens. The specimen itself is approximated as an object that provides phase shifts to the electron wavefront, sometimes in proportion to its scattering potential. The method of HRTEM also demands close attention to the performance of the objective lens and other characteristics of the microscope.
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Further Reading
The contents of the following are described in the Bibliography
S. Amelinckx and D. van Dyck: ‘Diffraction Contrast and High Resolution Microscopy of Structures and Structural Defects’, in Electron Diffraction Techniques, Volume 2, J. M. Cowley, Ed. (International Union of Crystallography, Oxford University Press, Oxford 1992).
J. Barry: ‘Computing for High-Resolution Images and Diffraction Patterns’. In Electron Diffraction Techniques, Volume 1, J. M. Cowley, Ed. (International Union of Crystallography, Oxford University Press, Oxford 1992).
P. R. Buseck, J. M. Cowley and L. Eyring: High-Resolution Transmission Electron Microscopy and Associated Techniques (Oxford University Press, Oxford 1988).
J. M. Cowley: Diffraction Physics, 2nd edn. (North—Holland, Amsterdam. 1975).
P. Grivet: Electron Optics, revised by A. Septier, translated by P. W. Hawkes (Pergamon, Oxford 1965).
S. J. Pennycook, D. E. Jesson, M. F. Chisholm, N. D. Browning, A. J. McGibbon, and M. M. McGibbon: ‘Z-Contrast Imaging in the Scanning Transmission Electron Microscope’, J. Micros. Soc. Amer. 1, 234 (1995).
L. Reimer: Transmission Electron Microscopy: Physics of Image Formation and Microanalysis, 4th edn. (Springer—Verlag, New York 1997).
J. C. Russ: Computer-Assisted Microscopy: The Measurement and Analysis of Images (Plenum Press, New York 1990).
F. G. Smith and J. H. Thomson: Optics, 2nd edn. (John Wiley and Sons, New York 1988).
J. C. H. Spence: Experimental High-Resolution Electron Microscopy (Oxford University Press, Oxford 1988).
G. Thomas and M. J. Goringe: Transmission Electron Microscopy of Materials (Wiley—Interscience, New York 1979).
D. B. Williams and C. B. Carter: Transmission Electron Microscopy: A Textbook for Materials Science (Plenum Press, New York 1996).
Chapter 10 title image of Pb precipitate in Al. Figure reprinted with the courtesy of U. Dahmen
J. M. Cowley and A. F. Moodie: Acta Cryst. 10, 609 (1957).
J. M. Cowley and A. F. Moodie: Acta Cryst. Ibid. 12, 353, 360, 367 (1959).
M. A. O’Keefe: ‘Electron image simulation; a complementary processing technique’. In: Proceedings of the 3rd Pfeffercorn Conference on Electron Optical Systems, Ocean City, MD ed. by J. J. Hren, F. A. Lenz, E. Munro, P. B. Sewell, and S. A. Bhatt (Scanning Electron Microscopy, Inc., Illinois 1984) pp. 209–220.
R. R. Meyer, J. Sloan, R. E. Dunin-Borkowski, A. I. Kirkland, M. C. Novotny, S. R. Bailey, J. L. Hutchison and M. L. H. Green: Science 289, 1324 (2000). Figure reproduced with the courtesy of J. L. Hutchison and the American Association for the Advancement of Science.
S. D. Hudson, H. T. Jung, V. Percec, W. D. Cho, G. Johansson, G. Ungar, V. S. K. Balagurusamy: Science 278, 449 (1997). Figure reproduced with the courtesy of S. D. Hudson and the American Association for the Advancement of Science.
S. R. Singh and J. M. Howe: Philos. Mag. A 66, 746 (1992). Figure reprinted with the courtesy of Taylor & Francis, Ltd.
S. Das, J. M. Howe and J. H. Perepezko: Metall. Mater. Trans. 27A, 1627 (1996). Figure reprinted with the courtesy of The Minerals, Metals & Materials Society.
G. Rao, J. M. Howe and P. Wynblatt, unpublished research.
U. Dahmen: Micros. Soc. Amer. Bull. 24, 341 (1994). Figure reprinted with the courtesy of Microscopy Society of America.
D. F. Sundo and J. M. Howe: ‘Theoretical and Experimental Analysis of the Effects of Composition and Strain on Image Contrast in High-Resolution Transmission Electron Microscopy’. In: Electron Microscopy 1990 - Vol. 1, Imaging Sciences ed. by G. W. Bailey (San Francisco Press, Inc., San Francisco 1990) p. 67. Figure reprinted with the courtesy of San Francisco Press, Inc.
J. M. Howe, D. P. Basile, N. Prabhu and M. K. Hatalis: ‘Minimum Detectable Solute Concentration and Accuracy of Compositional Analysis in Atomic-Resolution Microscopy’. In: Analytical Electron Microscopy - 1987 ed. by D. C. Joy (San Francisco Press, Inc., San Francisco 1987) p. 238. Figure reprinted with the courtesy of San Francisco Press, Inc.
Figure reprinted with the courtesy of R. Gronsky and D. Acklund.
J. M. Howe and S. J. Rozeveld: J. Micros. Res. Tech. 23, 233 (1992). Reprinted with the courtesy of Wiley-Liss, Inc.
M. M. Tsai: Determination of the Growth Mechanisms of TiH in Ti Using High-Resolution and Energy-Filtering Transmission Electron Microscopy. Ph.D. Thesis, University of Virginia, Charlottesville, VA (1997). Figure reprinted with the courtesy of Dr. M. M. Tsai.
10.14 such as Gatan Digital MicrographTM or NIH Image.
10.15 B. Laird and J. M. Howe, unpublished research.
R. Kilaas and R. Gronsky: Ultramicros. 16, 193 (1985). Figure reprinted with the courtesy of Elsevier Science Publishing B.V.
N. D. Browning, D. J. Wallis, P. D. Nellist and S. J. Pennycook: Micron 28, 334 (1997). Reprinted with the courtesy of Elsevier Science Ltd.
S. J. Pennycook, D. E. Jesson, M. F. Chisholm, N. D. Browning, A. J. McGibbon, and M. M. McGibbon: J. Micros. Soc. Amer. 1, 234 (1995). Reprinted with the courtesy of Microscopy Society of America.
A. Amali and P. Rez: Microsc. and Microanal. 3, 28 (1997).
P. M. Voyles and D. A. Muller, private communication. See also P. M. Voyles, D. A. Muller, J. L. Grazul, P. H. Citrin, and H-.J. L. Gossmann: Nature 416, 826 (2002).
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Fultz, B., Howe, J.M. (2002). High-Resolution TEM Imaging. In: Transmission Electron Microscopy and Diffractometry of Materials. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-04901-3_10
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DOI: https://doi.org/10.1007/978-3-662-04901-3_10
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