Abstract
Recent SIMS studies of polymer film surfaces [1,2] have identified and investigated several practical problems which may limit the applicability of the SIMS technique to these materials. These problems include (a) the high rate of ion beam damage, (b) the need for charge neutralisation leading to (c) the uncertainty of surface potential and (d) the possibility of electron stimulated desorption (ESD) of secondary ions.
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References
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Briggs, D., Brown, A., Van Den Berg, J.A., Vickerman, J.C. (1983). A Comparative Study of Organic Polymers by SIMS and FABMS. In: Benninghoven, A. (eds) Ion Formation from Organic Solids. Springer Series in Chemical Physics, vol 25. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-87148-1_18
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DOI: https://doi.org/10.1007/978-3-642-87148-1_18
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