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Optics Far Beyond the Diffraction Limit

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Springer Handbook of Lasers and Optics

Part of the book series: Springer Handbooks ((SHB))

Abstract

New developments in far-field light microscopy made possible to radically overcome the diffraction limit (ca. 200 nm laterally, 600 nm along the optical axis) of conventional far field microscopy. Here, three principal nanoscopy families are presented: Nanoscopy based on highly focused laser beams, such as 4 Pi-, and STED (stimulated emission depletion) microscopy; nanoscopy based on structured illumination excitation (SIE); and nanoscopy allowing superresolution even in the case of homogeneous excitation (spectrally assigned localization microscopy/SALM): With such techniques, it has become possible to analyze the spatial distribution of fluorescent molecules with a greatly increase light optical resolution down to a few nanometers (≈ 1/100 of the exciting wavelength).

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Abbreviations

2-D:

two-dimensional

2CLM:

dual-color localization microscopy

AID:

axial fluorescence intensity distribution

CCD:

charge-coupled device

CLSM:

confocal laser scanning fluorescence microscopy

CP:

coat protein

EM:

electromagnetic

FPALM:

fluorescence photoactivable localization microscopy

FT:

Fourier transform

FWHM:

full width at half-maximum

GSD:

ground-state depletion

GSDIM:

ground-state depletion imaging microscopy

LBO:

LiB3O5

LOBSTER:

light optical biostructure analysis at enhanced resolution

NA:

numerical aperture

NB:

narrow beam

NSOM:

near-field scanning optical microscopy

OTF:

optical transfer function

PA-GFP:

photoactivatable green fluorescent protein

PA:

photon avalanche

PALM:

photoactivated localization microscopy

PALMIRA:

photoactivated localization microscopy with running acquisition

PC:

photonic crystal

PEM:

patterned excitation microscopy

PML:

perfectly matched layer

PSF:

point spread function

RESOLFT:

reversible saturable optical fluorescence transition

RPE:

retinal pigment epithelium

RPM:

reversible photobleaching microscopy

SALM:

spectrally assigned localization microscopy

SHRImP:

single molecule high-resolution imaging with photobleaching

SI:

Système International

SIE:

structured illumination excitation

SIIM:

structured illumination interference microscopy

SMI:

spatially modulated illumination

SNR:

signal-to-noise ratio

SPDM:

spectral precision distance microscopy

SPEM:

saturated patterned excitation microscopy

SPM:

self-phase modulation

STED:

stimulated emission depletion

STORM:

stochastic optical reconstruction microscopy

SW:

standing wave

TMV:

Tobacco mosaic virus

UV:

ultraviolet

VIM:

virtual microscopy

dSTORM:

direct stochastic optical reconstruction microscopy

si:

semiinsulating

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  1. Lightoptical Nanoscopy Institute of Molecular Biology (IMB), Ackermannweg 4, 55128, Mainz, Germany

    Christoph Cremer

  2. Kirchhoff-Institute of Physics, University Heidelberg, Im Neuenheimer Feld 227, 69120, Heidelberg, Germany

    Christoph Cremer

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  1. Christoph Cremer
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  1. Department of Physics, University of Kassel, Heinrich-Plett-Str. 40, 34132, Kassel, Germany

    Frank Träger

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Cremer, C. (2012). Optics Far Beyond the Diffraction Limit. In: Träger, F. (eds) Springer Handbook of Lasers and Optics. Springer Handbooks. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-19409-2_20

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