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Mining Both Positive and Negative Impact-Oriented Sequential Rules from Transactional Data

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Advances in Knowledge Discovery and Data Mining (PAKDD 2009)

Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 5476))

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Abstract

Traditional sequential pattern mining deals with positive correlation between sequential patterns only, without considering negative relationship between them. In this paper, we present a notion of impact-oriented negative sequential rules, in which the left side is a positive sequential pattern or its negation, and the right side is a predefined outcome or its negation. Impact-oriented negative sequential rules are formally defined to show the impact of sequential patterns on the outcome, and an efficient algorithm is designed to discover both positive and negative impact-oriented sequential rules. Experimental results on both synthetic data and real-life data show the efficiency and effectiveness of the proposed technique.

This work was supported by the Australian Research Council (ARC) Linkage Project LP0775041 and Discovery Projects DP0667060 & DP0773412, and by the Early Career Researcher Grant from University of Technology, Sydney, Australia.

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References

  1. Agrawal, R., Imielinski, T., Swami, A.: Mining association rules between sets of items in large databases. In: Proc. of the ACM SIGMOD Int. Conf. on Management of Data, Washington D.C., USA, May 1993, pp. 207–216 (1993)

    Google Scholar 

  2. Agrawal, R., Srikant, R.: Mining sequential patterns. In: Yu, P.S., Chen, A.S.P. (eds.) Proc. of the 11th Int. Conf. on Data Engineering, Taipei, Taiwan, pp. 3–14 (1995)

    Google Scholar 

  3. Antonie, M.-L., Zaïane, O.R.: Mining positive and negative association rules: an approach for confined rules. In: Proc. of the 8th Eur. Conf. on Principles and Practice of Knowledge Discovery in Databases, New York, USA, pp. 27–38 (2004)

    Google Scholar 

  4. Ayres, J., Flannick, J., Gehrke, J., Yiu, T.: Sequential pattern mining using a bitmap representation. In: KDD 2002: Proc. of the 8th ACM SIGKDD Int. Conf. on Knowledge Discovery and Data Mining, New York, NY, USA, pp. 429–435 (2002)

    Google Scholar 

  5. Bannai, H., Hyyro, H., Shinohara, A., Takeda, M., Nakai, K., Miyano, S.: Finding optimal pairs of patterns. In: Jonassen, I., Kim, J. (eds.) WABI 2004. LNCS (LNBI), vol. 3240, pp. 450–462. Springer, Heidelberg (2004)

    Chapter  Google Scholar 

  6. Han, J., Pei, J., et al.: Freespan: frequent pattern-projected sequential pattern mining. In: KDD 2000: Proc. of the 6th ACM SIGKDD Int. Conf. on Knowledge Discovery and Data Mining, New York, NY, USA, pp. 355–359 (2000)

    Google Scholar 

  7. Lin, N.P., Chen, H.-J., Hao, W.-H.: Mining negative sequential patterns. In: Proc. of the 6th WSEAS Int. Conf. on Applied Computer Science, Hangzhou, China, pp. 654–658 (2007)

    Google Scholar 

  8. Ouyang, W.-M., Huang, Q.-H.: Mining negative sequential patterns in transaction databases. In: Proc. of 2007 Int. Conf. on Machine Learning and Cybernetics, Hong Kong, China, pp. 830–834 (2007)

    Google Scholar 

  9. Pei, J., Han, J., et al.: Prefixspan: Mining sequential patterns efficiently by prefix-projected pattern growth. In: ICDE 2001: Proc. of the 17th Int. Conf. on Data Engineering, Washington, DC, USA, p. 215 (2001)

    Google Scholar 

  10. Savasere, A., Omiecinski, E., Navathe, S.B.: Mining for strong negative associations in a large database of customer transactions. In: ICDE 1998: Proc. of the 14th Int. Conf. on Data Engineering, Washington, DC, USA, pp. 494–502 (1998)

    Google Scholar 

  11. Sun, X., Orlowska, M.E., Li, X.: Finding negative event-oriented patterns in long temporal sequences. In: Proc. of the 8th Pacific-Asia Conf. on Knowledge Discovery and Data Mining, Sydney, Australia, pp. 212–221 (May 2004)

    Google Scholar 

  12. Wu, X., Zhang, C., Zhang, S.: Efficient mining of both positive and negative association rules. ACM Transactions on Information Systems 22(3), 381–405 (2004)

    Article  Google Scholar 

  13. Zaki, M.J.: Spade: An efficient algorithm for mining frequent sequences. Machine Learning 42(1-2), 31–60 (2001)

    Article  MATH  Google Scholar 

  14. Zhao, Y., Zhang, H., Cao, L., Zhang, C., Bohlscheid, H.: Efficient mining of event-oriented negative sequential rules. In: Proc. of the 2008 IEEE/WIC/ACM Int. Conf. on Web Intelligence (WI 2008), Sydney, Australia, pp. 336–342 (December 2008)

    Google Scholar 

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Zhao, Y., Zhang, H., Cao, L., Zhang, C., Bohlscheid, H. (2009). Mining Both Positive and Negative Impact-Oriented Sequential Rules from Transactional Data. In: Theeramunkong, T., Kijsirikul, B., Cercone, N., Ho, TB. (eds) Advances in Knowledge Discovery and Data Mining. PAKDD 2009. Lecture Notes in Computer Science(), vol 5476. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-01307-2_65

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  • DOI: https://doi.org/10.1007/978-3-642-01307-2_65

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-01306-5

  • Online ISBN: 978-3-642-01307-2

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