Abstract
Mutation testing is a fault-based testing approach based on the competent programmer, and coupling effect hypotheses. One of the main difficulties faced in practice is due to the large number of mutants that can be generated for a given implementation. Earlier research to solve this problem has suggested variants of mutation testing, and finding an effective set of mutation operators. This paper presents an alternative approach for reducing the cost of testing by the identification of hierarchies among first-order mutants. The theory described here is also applicable to the quantitative assessment of testing effort and can be used to guide successive testing steps in fault-based testing.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Budd, T.A., DeMillo, R.A., Lipton, R.J., Sayward, F.G.: Theoretical and Empirical Studies on using Program Mutation to Test the Functional Correctness of Programs. In: 7th Symposium on Principles of Programming Languages, pp. 220–233. ACM, New York (1980)
Cooperating Validity Checker, Stanford University, USA, http://verify.stanford.edu/CVC/ (last accessed: August 14, 2004)
DeMillo, R.A., Lipton, R.J., Sayward, F.G.: Hints on Test Data Selection: Help for the Practicing Programmer. IEEE Computer 11(4), 34–41 (1978)
DeMillo, R.A., Jefferson Offutt, A.: Constraint-Based Automatic Test Data Generation. IEEE Transactions on Software Engineering 17(9), 900–910 (1991)
Duncan, I.M.M., Robson, D.J.: Ordered Mutation Testing. ACM SIGSOFT Software Engineering Notes 15, 29–30 (1990)
Harman, M., Hu, L., Hierons, R., Wegener, J., Sthamer, H., Baresel, A., Roper, M.: Testability Transformation. IEEE Transactions on Software Engineering 30(1), 3–16 (2004)
Hierons, R.M.: Comparing Test Sets and Criteria in the Presence of Test Hypotheses and Fault Domains. ACM Transactions on Software Engineering and Methodology 11(4), 427–448 (2002)
Howden, W.E.: Weak Mutation Testing and Completeness of Test Sets. IEEE Transactions on Software Engineering 8, 371–379 (1982)
King, K.N., Offutt, A.J.: A Fortran Language System for Mutation-Based Software Testing. Software Practice and Experience 21(7), 685–718 (1991)
Kuhn, D.R.: Fault Classes and Error Detection Capability of Specification-based Testing. ACM Transactions on Software Engineering and Methodology 8(4), 411–424 (1999)
Marick, B.: The Weak Mutation Hypothesis. In: International Symposium on Software Testing and Analysis, pp. 190–199 (1991)
Morell, L.J.: A Theory of Fault-based Testing. IEEE Transactions on Software Engineering 16(8), 844–857 (1990)
Offutt, A.J., Pan, J.: Automatically Detecting Equivalent Mutants and Infeasible Paths. Software Testing, Verification and Reliability 7(3), 165–192 (1997)
Offutt, A.J., Rothermel, G., Untch, R.H., Zapf, C.: An Experimental Determination of Sufficient Mutant Operator. ACM Transactions on Software Engineering and Methodology 5(2), 99–118 (1996)
Offutt, A.J., Untch, R.H.: Mutation 2000: Uniting the Orthogonal. In: Wong, W.E. (ed.) Mutation Testing in the Twentieth and the Twenty First Centuries, pp. 45–55. Kluwer, Dordrecht (2000)
Richardson, D.J., Thompson, M.C.: An Analysis of Test Data Selection Criteria using the RELAY Model of Fault Detection. IEEE Transactions on Software Engineering 19(6), 533–553 (1993)
Riddell, I.J., Hennell, M.A., Woodward, M.R., Hedley, D.: Practical Aspects of Program Mutation. Technical report, University of Liverpool, UK (1982)
Tai, K.-C.: Theory of Fault-based Predicate Testing for Computer Programs. IEEE Transactions on Software Engineering 22(8), 552–562 (1996)
Tsuchiya, T., Kikuno, T.: On Fault Classes and Error Detection Capability of Specification-based Testing. ACM Transactions on Software Engineering and Methodology 11(1), 58–62 (2002)
Untch, R.H., Offutt, A.J., Harrold, M.J.: Mutation Analysis Using Mutant Schemata. In: International Symposium on Software Testing and Analysis, pp. 139–148 (1993)
Voas, J.M.: PIE: A Dynamic Failure-Based Technique. IEEE Transactions on Software Engineering 18(2), 717–727 (1992)
Weyuker, E., Gorodia, T., Singh, A.: Automatically Generating Test Data from a Boolean Specification. IEEE Transactions on Software Engineering 20(5), 353–363 (1994)
Wong, W.E., Mathur, A.P.: Reducing the Cost of Mutation Testing: An Empirical Study. Journal of Systems and Software 31(3), 185–196 (1995)
Woodward, M.R.: Concerning Ordered Mutation Testing of Relational Operators. Software Testing, Verification and Reliability 1(3), 35–40 (1991)
Woodward, M.R., Halewood, K.: From Weak to Strong, Dead or Alive? An Analysis of some Mutation Testing Issues. In: 2nd Workshop on Software Testing, Verification, and Analysis, July 1988, pp. 152–158 (1988)
Woodward, M.R., Hennell, M.A., Hedley, D.: A Limited Mutation Approach to Program Testing. Technical report, University of Liverpool, UK (May 1980)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2005 IFIP International Federation for Information Processing
About this paper
Cite this paper
Kapoor, K., Bowen, J.P. (2005). Ordering Mutants to Minimise Test Effort in Mutation Testing. In: Grabowski, J., Nielsen, B. (eds) Formal Approaches to Software Testing. FATES 2004. Lecture Notes in Computer Science, vol 3395. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-31848-4_14
Download citation
DOI: https://doi.org/10.1007/978-3-540-31848-4_14
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-25109-5
Online ISBN: 978-3-540-31848-4
eBook Packages: Computer ScienceComputer Science (R0)