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Measurement of Surface Topography Using Computed Tomography

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Advances in Manufacturing

Part of the book series: Lecture Notes in Mechanical Engineering ((LNME))

Abstract

Computed tomography is a new field of coordinate measuring metrology. For this reason, many areas of its application are not yet completely known. The paper presents reproduction possibilities of geometrical structure of a surface by computer tomography. Results are combined with data from a classical tactile profilometer to measure surface topography. Comparison of the obtained values makes it possible to confirm the usefulness of computer tomography to reconstruct the surface geometry. This is especially important when indoor surfaces are indispensable. Such measurement with any other device than computer tomograph is not possible or requires damage of the element being measured. As a result of the measurement by means of a computer tomograph, from the same measurement data we obtain not only information about the surface and shape of the element, but also—as an additional advantage—ability to evaluate internal structure of material, for example its porosity or fibre distribution in case of composites.

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Acknowledgements

The presented research results were funded with grants PBS2/NCBiR (No. PBS2/A6/20/2013) “Research and assessment of the reliability of modern methods of measuring surface topography in micro- and nanoscale”.

The presented research results were funded with grants for education allocated by the Ministry of Science and Higher Education in Poland (No. 02/22/DSPB/1387).

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Authors and Affiliations

  1. Faculty of Mechanical Engineering and Management, Poznan University of Technology, pl. M. Sklodowskiej-Curie 5, PL-60965, Poznan, Poland

    Bartosz Gapinski, Michal Wieczorowski & Lidia Marciniak-Podsadna

  2. University of Vigo, Vigo, Spain

    Alejandro Pereira Domínguez & Anton Martinez Rey

  3. VŠB—Technical University of Ostrava, Ostrava, Czech Republic

    Lenka Cepova

Authors
  1. Bartosz Gapinski
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  2. Michal Wieczorowski
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  3. Lidia Marciniak-Podsadna
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  4. Alejandro Pereira Domínguez
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  5. Lenka Cepova
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  6. Anton Martinez Rey
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Corresponding author

Correspondence to Bartosz Gapinski .

Editor information

Editors and Affiliations

  1. Poznan University of Technology, Poznań, Poland

    Adam Hamrol

  2. Poznan University of Technology, Poznań, Poland

    Olaf Ciszak

  3. Poznan University of Technology, Poznań, Poland

    Stanisław Legutko

  4. Poznan University of Technology, Poznań, Poland

    Mieczysław Jurczyk

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Gapinski, B., Wieczorowski, M., Marciniak-Podsadna, L., Pereira Domínguez, A., Cepova, L., Martinez Rey, A. (2018). Measurement of Surface Topography Using Computed Tomography. In: Hamrol, A., Ciszak, O., Legutko, S., Jurczyk, M. (eds) Advances in Manufacturing. Lecture Notes in Mechanical Engineering. Springer, Cham. https://doi.org/10.1007/978-3-319-68619-6_79

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  • DOI: https://doi.org/10.1007/978-3-319-68619-6_79

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-68618-9

  • Online ISBN: 978-3-319-68619-6

  • eBook Packages: EngineeringEngineering (R0)

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