Abstract
This book introduces the concepts of soft errors in FPGAs and GPUs. The chapters cover radiation effects in FPGAs, fault-tolerant techniques for FPGAs, use of COTS FPGAs in aerospace applications, experimental data of FPGAs under radiation, FPGA embedded processors under radiation, and fault injection in FPGAs. Since dedicated parallel processing architectures such as GPUs have become more desirable in aerospace applications due to high computational power, GPU analysis under radiation is also discussed.
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References
Nicolaidis M (2011) Soft errors in modern electronic systems. Springer, New York, p 318
Stassinopolous EG, Raymond JP (1988) The space radiation environment for electronics. Proc IEEE 76:1423–1442
Dodd PE, Massengill LW (2003) Basic mechanisms and modeling of single-event upset in digital microelectronics. IEEE Trans Nucl Sci 50(3):583–602
Kastensmidt FL, Reis R, Carro L (2006) Fault-tolerance techniques for SRAM-based FPGAs (frontiers in electronic testing). Springer, New York
Microsemi. ProASIC3, IGLOO and SmartFusion flash family FPGAs datasheet. www.microsemi.com
Rezgui S, Louris P, Sharmin R (2010) SEE characterization of the new RTAX-DSP (RTAX-D) antifuse-based FPGA. IEEE Trans Nucl Sci 57(6):3537–3546
Rech P, Aguiar C, Frost C, Carro L (2013) An efficient and experimentally tuned software-based hardening strategy for matrix multiplication on GPUs. IEEE Trans Nucl Sci 60(4):2797–2804
Rech P, Pilla L, Navaux POA, Carro L (2014) Impact of GPUs parallelism management on safety-critical and HPC applications reliability. In: Proceeding IEEE international conference on dependable systems and networks (DSN), June 2014, pp 455–466
Mukherjee SS, Emer J, Reinhardt SK (2005) The soft error problem: an architectural perspective. In: High-performance computer architecture, 2005. HPCA-11. 11th international symposium on, 12–16 Feb 2005, pp 243–247
Schrimpf RD, Fleetwood DM (2004) Radiation effects and soft errors in integrated circuits and electronic devices. Word Scientific, Singapore
Anghel L, Alexandrescu D, Nicolaidis M (2000) Evaluation of a soft error tolerance technique based on time and/or space redundancy. In: The Proceedings of symposium on integrated circuits and systems design, SBCCI, 13, pp 237–242
Oliveira DAG, Rech P, Pilla LL, Navaux POA, Carro L (2014) GPGPUs ECC efficiency and efficacy. In: International symposium on defect and fault tolerance in VLSI and nanotechnology systems
Pilla LL, Rech P, Silvestri F, Frost C, Navaux POA, Sonza Reorda M, Carro L (2014) Software-based hardening strategies for neutron sensitive FFT algorithms on GPUs. IEEE Trans Nucl Sci 61(4):1874–1880
Sterpone L, Violante M (2007) A new partial reconfiguration-based fault-injection system to evaluate SEU effects in SRAM-based FPGAs. IEEE Trans Nucl Sci 54(4):965–970
Fang B, Pattabiraman K, Ripeanu M, Gurumurthi S (2014) GPU-Qin: A methodology for evaluating the error resilience of GPGPU applications. In: Proceedings of the IEEE international symposium on performance analysis of systems and software (ISPASS)
Xilinx, Inc. (2013) Device reliability report third quarter 2013. http://www.xilinx.com/support/documentation/user_guides/ug116.pdf
Violante M, Sterpone L, Manuzzato A, Gerardin S, Rech P, Bagatin M, Paccagnella A, Andreani C, Gorini G, Pietropaolo A, Cargarilli G, Pontarelli S, Frost C (2007) A new hardware/software platform and a new 1/E neutron source for soft error studies: testing FPGAs at the ISIS facility. IEEE Trans Nucl Sci 54(4):1184–1189
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Kastensmidt, F., Rech, P. (2016). Radiation Effects and Fault Tolerance Techniques for FPGAs and GPUs. In: Kastensmidt, F., Rech, P. (eds) FPGAs and Parallel Architectures for Aerospace Applications. Springer, Cham. https://doi.org/10.1007/978-3-319-14352-1_1
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DOI: https://doi.org/10.1007/978-3-319-14352-1_1
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-14351-4
Online ISBN: 978-3-319-14352-1
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