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An Attention-Guided Deep Regression Model for Landmark Detection in Cephalograms

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Medical Image Computing and Computer Assisted Intervention – MICCAI 2019 (MICCAI 2019)

Part of the book series: Lecture Notes in Computer Science ((LNIP,volume 11769))

Abstract

Cephalometric tracing method is usually used in orthodontic diagnosis and treatment planning. In this paper, we propose a deep learning based framework to automatically detect anatomical landmarks in cephalometric X-ray images. We train the deep encoder-decoder model for landmark detection, which combines global landmark configuration with local high-resolution feature responses. The proposed framework is based on a 2-stage u-net, regressing the multi-channel heatmaps for landmark detection. In this framework, we embed attention mechanism with global stage heatmaps, guiding the local stage inferring, to regress the local heatmap patches in a high resolution. Besides, an Expansive Exploration strategy is applied to improve robustness while inferring, expanding the searching scope without increasing model complexity. We have evaluated the proposed framework in the most widely-used public dataset of landmark detection in cephalometric X-ray images. With less computation and manually tuning, the proposed framework achieves state-of-the-art results.

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Acknowledgement

This work was supported in part by the National Natural Science Foundation of China under Grant 61671339, 61432014 and 61772402, and in part by National High-Level Talents Special Support Program of China under Grant CS31117200001.

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Correspondence to Xinbo Gao .

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Zhong, Z., Li, J., Zhang, Z., Jiao, Z., Gao, X. (2019). An Attention-Guided Deep Regression Model for Landmark Detection in Cephalograms. In: Shen, D., et al. Medical Image Computing and Computer Assisted Intervention – MICCAI 2019. MICCAI 2019. Lecture Notes in Computer Science(), vol 11769. Springer, Cham. https://doi.org/10.1007/978-3-030-32226-7_60

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  • DOI: https://doi.org/10.1007/978-3-030-32226-7_60

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-030-32225-0

  • Online ISBN: 978-3-030-32226-7

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