Abstract
Convergent beam electron diffraction (CBD) is a technique with a long history of gradual development which has recently become widely available through the development of commercial TEM/STEM electron microscopes. The technique was discovered by KOSSELL and MOLLENSTEDT (1939) who obtained some quite remarkably good results when one realizes that the size of focussed probe they were working with was comparatively large. Most specimens are so irregular that there would be considerably thickness variation within such areas producing a thickness average of the information. Further, few specimens are so flat that some important angular average will not occur over such areas. Thickness and orientation are two crucial parameters of electron diffraction and it is essential to eliminate their variation within the illuminated volume if meaningful results are to be obtained.
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Steeds, J.W. (1979). Convergent Beam Electron Diffraction. In: Hren, J.J., Goldstein, J.I., Joy, D.C. (eds) Introduction to Analytical Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-5581-7_15
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