Abstract
In the three articles that follow, manufacturers of commercial electron backscatter diffraction (EBSD) units describe aspects of their systems. These articles provide a snapshot of the state-of-the-art hardware and software capabilities at the beginning of the year 2000. However, things are changing very rapidly in this new and exciting field. EBSD is very important. It will revolutionize scanning electron microscopy for all applications that involve crystalline material. More than that, EBSD will have a major impact on other fields. Many characterization experiments that would have been done using other techniques will now be done, and done better, using EBSD on the scanning electron microscope (SEM).
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Reference
Eades, J.A., Choosing an electron backscattering pattern (EBSP) system, Microsc. Microanal. 5 (Suppl 2) 250–251 (1999)
Reprinted in a slightly modified form in Microscopy Today (in press).
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© 2000 Springer Science+Business Media New York
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Eades, A. (2000). EBSD: Buying a System. In: Schwartz, A.J., Kumar, M., Adams, B.L. (eds) Electron Backscatter Diffraction in Materials Science. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-3205-4_10
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DOI: https://doi.org/10.1007/978-1-4757-3205-4_10
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4757-3207-8
Online ISBN: 978-1-4757-3205-4
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