Abstract
A comparison study of the adaptability of several commercially available diffractometers for X-ray absorption fine- structure studies was carried out. The following experimental arrangements were tested:
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Continuous scanning with a proportional counter recording total counts accumulated at predetermined intervals.
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Point-by-point scanning (manual and automatic) using a scintillation counter, a proportional counter, and a geiger counter.
Several kinds of slit geometries, X-ray tubes, and sample thicknesses have been tested. All measurements were carried out using copper foils having minimum preferred orientation and silicon single-crystal analyzers. The results were compared to those obtained using a two-crystal instrument employing two parallel silicon crystals and a scintillation counter followed by a pulse-height analyzer. It is concluded that comparative measurement can be carried out with commercial instruments but that quantitatively accurate absolute determinations of the edge structure require more highly stabilized X-ray generators than those presently manufactured.
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References
C.H. Shaw, Theory of Alloy Phases, American Society for Metals, Cleveland (1956), p. 13.
A.E. Sandstrom, Handbuch der Physik, Vol. 30, Springer Verlag, Berlin (1957), p. 78.
M. Sawada et al., Ann. Rep. Scient. Works, Fac. Sci. Osaka Univ. 7, 1 (1959).
T. Hayasi, Sci. Rep. Tohoku Univ. (Section I), 25, 661 (1936);
T. Hayasi, Sci. Rep. Tohoku Univ. (Section I), 36, 225 (1952).
Reuben S. Krogstad, Ph. D. thesis, State College of Washington (1955).
R. Van Nordstrand, Private communication.
L.G. Parratt, C. F. Hempstead, and E.L. Jossem, ASTIA Document No. AD- 95207, July 15, 1956.
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© 1963 Society for Applied Spectroscopy Chicago, Illinois
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Klems, G.J., Das, B.N., Azároff, L.V. (1963). Single-Crystal Spectrometers for X-Ray Absorption Spectroscopy. In: Ferraro, J.R., Ziomek, J.S. (eds) Developments in Applied Spectroscopy. Developments in Applied Spectroscopy, vol 2. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-8685-8_26
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DOI: https://doi.org/10.1007/978-1-4684-8685-8_26
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