Abstract
An indentation method for determining the adhesion of interfaces between thin films and substrates has been developed. The method provides a quantitative measure of the interface fracture resistance and has the advantage of simplicity and reproducibility The method has been demonstrated for a range of ZnO/Si systems and the adherence has been correlated with acoustic properties.
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© 1981 Plenum Press, New York
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Chiang, S.S., Marshall, D.B., Evans, A.G. (1981). A Simple Method for Adhesion Measurements. In: Pask, J., Evans, A. (eds) Surfaces and Interfaces in Ceramic and Ceramic — Metal Systems. Materials Science Research, vol 14. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-3947-2_53
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DOI: https://doi.org/10.1007/978-1-4684-3947-2_53
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