X-Ray Diffraction Topography: Principles and Techniques

Abstract

The first X-ray topographic experiment with the aim of studying the perfection of large single crystals was performed by Berg(1931). Using a simple experimental setup, he could reveal the lattice perturbations at the cleavage faces of a large sodium chloride crystal before and after plastic deformation. Berg’s reflection technique (Bragg case) was refined by (1945) and applied to the transmission (Laue) case by (1958). Another pioneering experiment was performed by Ramachandran (1945), who studied the perfection of diamond plates in transmission by applying a white-beam technique. Milestones of X-ray topography, stimulating rapid instrumental developments and wide-spread applications, were the introduction of the doublecrystal method by (1952) and (1958), and — to an even larger extent — of “projection” and “section” topography by (1959). In later years further progress in X-ray topography was initiated by (1974) who showed that topographs could be recorded within a few seconds by the use of white synchrotron radiation (Laue technique, see below). The availability of synchrotron radiation sources has started numerous methodical and instrumental developments and opened new fields of application of diffraction topography (see Baruchel, this volume).