Abstract
This chapter focuses on nonequilibrium carrier dynamics in semiconductors through the evaluation of time dependent optical experiments. Using ensemble Monte Carlo simulations coupled with detailed band structure calculations, we show how the evolution of photoexcited distribution functions are determined. Evaluating photoexcitation experiments with simple models (i.e., without Monte Carlo) poses severe approximations and leads to misunderstandings. We show that Monte Carlo simulations are essential to modeling photoexcitation experiments, but that calculating the distribution functions alone is not enough to fully understand the optical measurements. To relate to the experimental quantities of interest, the distribution functions must weighted by the optical matrix elements and joint density of states and summed over all allowed transitions. With complete calculations including Monte Carlo simulations, the optical experiments are shown to provide reliable details on scattering rates, relaxation channels, and band structure — valuable information for characterizing materials and carrier dynamics.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
E. M. Conwell,in Solid State Physics,Advances in Research and Applications„edited by Seitz,Turnbull,and Ehrenreich (New York, 1967) Vol. 9.
K. Hess, Advanced Theory of Semiconductor Devices, Prentice Hall, Englewood Cliffs, NJ (1988).
R.W. Schoenlein, W. Z. Lin, S. D. Brorson,E. P. Ippen and J. G. Fujimoto,Appl. Phys. Lett. 51, 1442 (1987).
W. Z. Lin, J. G. Fujimoto, E. P. Ippen and R. A. Logan,Appl. Phys. Lett. 51, 161 (1987).
W. Z. Lin, R. W. Schoenlein, J. G. Fujimoto and E. P. Ippen,IEEE J. Quantum Electron. QE-24, 267 (1988).
W. H. Knox, C. Hirlimann, D. A. B. Miller,J. Shah, D. S. Chemla and C. V. Shank,Phys. Rev.Lett. 56, 1191 (1986).
J. L. Oudar, D. Hulin, A. Migus, A. Antonetti and F. Alexandre,Phys. Rev. Lett. 55, 2074 (1985).
C. W. W. Bradley, R. A. Taylor and J. F. Ryan,Solid State Electron. 32, 1173 (1989).
M. Rosker, F. Wise and C. L. Tang,Appl. Phys. Lett. 49, 1726 (1986).
W. Z. Lin, J. G. Fujimoto, E. P. Ippen and R. A. Logan,Appl. Phys. Lett. 50, 124 (1987).
P. C. Becker, H. L. Fragnito, C. H. Brito Cruz, J. Shah, R. L. Fork, J. E. Cunningham, J. E. Henry and C. V. Shank,Appl. Phys. Lett. 53, 2089 (1988).
C. J. Stanton, D. W. Bailey and K. Hess,IEEE J Quant. Electron. QE-24, 1641 (1988).
P. C. Becker, H. L. Fragnito, C. H. Brito Cruz, R. L. Fork,J. E. Cunningham, J. E. Henry and C. V. Shank,Phys. Rev. Lett. 61, 1647 (1988).
M. C. Nuss, D. H. Auston and F. Capasso,Phys. Rev. Lett. 58, 2355 (1987).
B. Bebb and E.W. Williams in Semiconductors and Semimetals Willardson and Beers,edited by R.K. Willardson and A.C. Beers(Academic,New York,1972),Vol. 7.
B. P. Zakharchenya, D. N. Mirlin, V. I. Perel’ and I. I. Reshina,Soy. Phys. Usp. 25, 143 (1982).
G. Fasol, W. Hackenberg, H. P.. Hughes, K. Ploog, E. Bauser and H. Kano,Phys. Rev. B 41, 1461 (1990).
R. G. Ulbrich, J. A. Kash and J. C. Tsang,Phys. Rev. Lett. 62, 949 (1989).
B. S. Wherrett, A. L. Smirl and T. F. Boggess,IEEE J. Quant. Electron. QE-19, 680 (1983).
D. J. Erskine,Ph.D. dissertation (Cornell University,Ithaca,NY, 1984).
C. L. Tang, I. A. Walmsley, and F. W. Wise,Appl. Phys. Lett. 52, 850 (1988).
J. Collet, T. Amand and M. Pugnet, Phys. Lett. 96A, 368 (1983).
J. Collet and T. Amand,J. Phys. Chem. Solids 47, 153 (1986).
M. Asche and O. G. Sarbei,Phys. Stat. Sol. (b) 126, 607 (1984).
M. Asche and O. G. Sarbei,Phys. Stat. Sol. (b) 141, 487 (1987).
C. J. Stanton, D. W. Bailey, K. Hess and Y.C. Chang,Phys. Rev. B 37, 6575 (1988).
M. J. Kann, A. M. Kriman and D. K. Ferry,Solid State Electron. 32, 1831 (1989).
M.A. Osman and D.K. Ferry,Phys. Rev. B 36,6018(1987).
F. H. Pollak, C. W. Higginbotham and M. Cardona,J. Phys. Soc. Japan 21 supplement, 20 (1966).
D. W. Bailey, C. J. Stanton and K. Hess,Phys. Rev. B 42, 3423 (1990).
H.-J. Drouhin, C. Hermann and G. Lampel,Phys. Rev. B 31, 3859 (1985).
H. Shichijo and K. Hess,Phys. Rev. B 23, 4197 (1981).
M. V. Fischetti and S. E. Laux,Phys. Rev B 38, 9721 (1988).
K. Brennan and K. Hess,Phys. Rev. B 29, 5581 (1984).
K. Sadra, C. M. Maziar, B. G. Streetman and D. S. Tang,J. Appl. Phys. 66, 4791 (1989).
J.D. Wiley in Semiconductors and Semimetals,edited by R.K. Willard-son and A.C. Beers(Academic,New York,1971) Vol. 6.
Even for k = 0, Wiley’s expression is not exact since it neglects coupling to higher bands.
C. Jacoboni and L. Reggiani,Rev. Mod.Phys. 55, 645 (1983).
An explanation of how the Bloch overlap factors are calculated from the eigenfunctions returned by the k.p program can be found in ref. 30.
M. Costato and L. Regianni,Phys. Stat. Sol. (b) 59, 47 (1973).
M. Costato and L. Regianni,Phys. Stat. Sol. (b) 59, 471 (1973).
Y. C. Chang, D. Z.-Y. Ting, J. Y. Tang and K. Hess,Appl. Phys. Lett. 42, 76 (1983).
K. Kim, B. A. Mason and K. Hess, Phys. Rev. B 36, 6547 (1987).
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1991 Springer Science+Business Media New York
About this chapter
Cite this chapter
Stanton, C.J., Bailey, D.W. (1991). Evaluating Photoexcitation Experiments Using Monte Carlo Simulations. In: Hess, K. (eds) Monte Carlo Device Simulation. The Springer International Series in Engineering and Computer Science, vol 144. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-4026-7_3
Download citation
DOI: https://doi.org/10.1007/978-1-4615-4026-7_3
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4613-6800-7
Online ISBN: 978-1-4615-4026-7
eBook Packages: Springer Book Archive