Abstract
A student of energy dispersive x-ray microanalysis soon learns that it is better to have a spectrometer with improved resolution because it is easier to recognize individual characteristic lines from different elements. However, a spectrum obtained in a few seconds can appear “ragged,” and random distortion of peak shapes can confuse the distinction between single peaks and overlapping multiplets. Thus, the student learns that it is also important to obtain good counting statistics by increasing beam current or by extending the acquisition time so that the spectrum is not too ragged in appearance.
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Statham, P.J. (1995). Quantifying Benefits of Resolution and Count Rate in EDX Microanalysis. In: Williams, D.B., Goldstein, J.I., Newbury, D.E. (eds) X-Ray Spectrometry in Electron Beam Instruments. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-1825-9_8
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DOI: https://doi.org/10.1007/978-1-4615-1825-9_8
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