Skip to main content

Abstract

In this paper, we introduce a new multivariate statistical process control chart for outliers detection using kernel local linear embedding algorithm. The proposed control chart is effective in the detection of outliers, and its control limits are derived from the eigen-analysis of the kernel matrix in the Hilbert feature space. Our experimental results show the much improved performance of the proposed control chart in comparison with existing multivariate monitoring and controlling charts.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 169.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 219.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 219.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. D.C. Montgomery, Introduction to Statistical Quality Control, John Wiley & Sons, 2005.

    Google Scholar 

  2. K. Yang and J. Trewn, Multivariate Statistical Methods in Quality Management, Mc Graw Hill Professional, 2004.

    Google Scholar 

  3. K.H. Chen, D.S. Boning, and R.E. Welch, “Multivariate statistical process control and signature analysis using eigenfactor detection methods,” Proc. Symposium on the Interface of Computer Science and Statistics, Costa Mesa, CA, 2001.

    Google Scholar 

  4. I.T. Jolliffe, Principal Component Analysis, New York: Springer, 1986.

    Google Scholar 

  5. J.A. Vargas, “Robust estimation in multivariate control charts for individual observations,” Journal of Quality Technology, vol. 35, no. 4, pp. 367-376, 2003

    MathSciNet  Google Scholar 

  6. N.D. Tracy, J.C. Young, and R.L. Mason, “Multivariate quality control charts for individual observations,” Journal of Quality Technology, vol. 24, no. 22, pp. 88-95, 1992.

    Google Scholar 

  7. J.H. Sullivan and W.H. Woodall, “A comparison of multivariate control charts for individual observations,” Journal of Quality Technology, vol. 28, no. 24, pp. 398-408, 1996.

    Google Scholar 

  8. F.A. Alqallaf, K.P. Konis, and R.D. Martin, and R.H. Zamar, “Scalable robust covariance and correlation estimates for data mining,” Proc. ACM SIGKDD international conference on Knowledge discovery and data mining, pp. 14-23, 2002.

    Google Scholar 

  9. S. Haykin, Neural Networks: A Comprehensive Foundation, Prentice Hall, 2nd edition, 1998.

    Google Scholar 

  10. B. Scholkopf, A. Smola, and K-R. Muller, “Nonlinear component analysis as a kernel eigenvalue problem,” Neural Computation, vol. 10, pp. 1299-1319, 1998.

    Article  Google Scholar 

  11. J. Shawe-Taylor and C. Williams, “The stability of kernel principal components analysis and its relation to the process eigenspectrum.,” Advances in neural information processing systems, vol. 15, 2003.

    Google Scholar 

  12. S. Roweis and L. Saul, “Nonlinear dimensionality reduction by locally linear embedding,” Science, vol. 290, no. 5500, pp. 2323-2326, 2000.

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2008 Springer Science+Business Media B.V.

About this paper

Cite this paper

Tsagaroulis, T., Hamza, A.B. (2008). Kernel Locally Linear Embedding Algorithm for Quality Control. In: Sobh, T., Elleithy, K., Mahmood, A., Karim, M.A. (eds) Novel Algorithms and Techniques In Telecommunications, Automation and Industrial Electronics. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-8737-0_1

Download citation

  • DOI: https://doi.org/10.1007/978-1-4020-8737-0_1

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-1-4020-8736-3

  • Online ISBN: 978-1-4020-8737-0

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics