Abstract
Prediction of the plastic strength of single crystals based on the collective dynamics of dislocations has been a challenge for computational materials science for a number of years. The difficulty lies in the inability of the existing dislocation dynamics (DD) codes to handle a sufficiently large number of dislocation lines, in order to be statistically representative and to reproduce experimentally observed microstructures. A new massively-parallel DD code is developed that is capable of modeling million-dislocation systems by employing thousands of processors. We discuss the general aspects of this code that make such large scale simulations possible, as well as a few initial simulation results.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Similar content being viewed by others
References
J. P. Hirth and J. Lothe, Theory of Dislocations, (Wiley, New York, 1982).
H. Mughrabi, T. Ungar, W. Kienle and M. Wilkens, Phil. Mag. A 53, 793 (1986).
Wei Cai, Atornistic and Mesoscale Modeling of Dislocation Mobility, Ph.D. Thesis, M.I.T., May (2001).
Wei Cai, et al. unpublished.
V. V. Bulatov, M. Rhee and W. Cai, Mater. Soc. Proc. 653, Z1.3.1 (2001).
Wei Cai, Vasily V. Bulatov, Jinpeng Chang, Ju Li and Sidney Yip, Philos. Mag. A, 83, 539 (2003).
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2004 Springer Science+Business Media Dordrecht
About this paper
Cite this paper
Cai, W. et al. (2004). Massively-Parallel Dislocation Dynamics Simulations. In: Kitagawa, H., Shibutani, Y. (eds) IUTAM Symposium on Mesoscopic Dynamics of Fracture Process and Materials Strength. Solid Mechanics and its Applications, vol 115. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-2111-4_1
Download citation
DOI: https://doi.org/10.1007/978-1-4020-2111-4_1
Publisher Name: Springer, Dordrecht
Print ISBN: 978-90-481-6576-6
Online ISBN: 978-1-4020-2111-4
eBook Packages: Springer Book Archive