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Strain Mapping Using Electron Backscatter Diffraction

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Electron Backscatter Diffraction in Materials Science

In this chapter we review the progress that has been made toward elastic strain (i.e., stress) mapping using electron backscatter diffraction. In particular we focus on development of an analysis method based on using cross-correlation to determine small shifts in the EBSD patterns with respect to a reference pattern. The pattern shifts are determined at many subregions dispersed across the wide angular span of the EBSD pattern, and the magnitude and angular distribution of shifts allows the strain and rotation tensor to be determined. Pattern shifts at a resolution of ±0.05 pixels, or in some cases even better, have been reported, which corresponds to a sensitivity of ∼±10–4 in the components of the strain and rotation tensor.

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Acknowledgments

The authors are grateful to Dr. Mark Vaudin (NIST), Mr. Teruki Ishido (Matsushita Electric Industrial Co.), Dr. Cathy Vartulli (Texas Instruments), Mr. Benjamin Britton (Oxford University), Mr. David Randman (Oxford University), and Dr. Eleanor Clarke (Oxford University) for enjoyable and insightful discussion during development and application of this technique.

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Authors and Affiliations

  1. Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK

    Angus J. Wilkinson, David J. Dingley & Graham Meaden

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  1. Angus J. Wilkinson
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  2. David J. Dingley
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  3. Graham Meaden
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Correspondence to Angus J. Wilkinson .

Editor information

Editors and Affiliations

  1. Physical Sciences Directorate, Lawrence Livermore National Laboratory, E. Ave. 7000, Livermore, 94550, U.S.A.

    Adam J. Schwartz

  2. Chemistry, Materials, Earth, & Life , Lawrence Livermore National Laboratory, East Ave. 7000, Livermore, 94550, U.S.A.

    Mukul Kumar

  3. Dept. Mechanical Engineering, Brigham Young University, Provo, 84602, U.S.A.

    Brent L. Adams

  4. School of Mechanical &, Washington State University, Pullman, 99164-2920, U.S.A.

    David P. Field

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Wilkinson, A.J., Dingley, D.J., Meaden, G. (2009). Strain Mapping Using Electron Backscatter Diffraction. In: Schwartz, A., Kumar, M., Adams, B., Field, D. (eds) Electron Backscatter Diffraction in Materials Science. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-88136-2_17

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