Abstract
The absorption of laser radiation can be employed in a variety of ways for pollutant detection and monitoring. Under point-sampling conditions, where sample pressure can be reduced, or during in situ measurements at high altitudes, where spectral lines are narrow, very specific and sensitive detection can be accomplished. Short-path in situ monitoring of effluents at their sources can be performed; and while not as free from potential interferences at atmospheric pressure, it nevertheless, offers the advantage that the stream under investigation is not disturbed by the measurement. This is particularly important for some of the more reactive species. Finally, long-path monitoring yields information as to the average pollutant concentration over a relatively long atmospheric path—an important parameter for the evaluation of various mathematical models being developed for regional pollution prediction. Techniques based on long-path spectral information are being developed to provide continuous surveillance of the troposphere and stratosphere from either airborne or ground-based instrumentation.
With 17 Figures
This work was supported by the National Science Foundation (RANN), the U.S. Environmental Protection Agency, and the Department of the Air Force.
Preview
Unable to display preview. Download preview PDF.
References
H. Kildal, R. L. Byer: Proc. IEEE 59, 1644 (1971)
P. L. Hanst: In Advances in Environmental Science and Technology, Vol. 2, ed. by J. N. Pitts and R. L. Metcalf (John Wiley & Sons, New York 1971) Chapter 4. see also [6.28]
P. L. Hanst: Symposium on Long Path Techniques, U.S. Environmental Protection Agency, Research Triangle Park, N. C. (4 February 1975)
A. R. Barringer: J. Opt. Soc. Am. 60, 729 (1970)
D. E. Burgh, D. A. Gryvnak: In Analytical Methods Applied to Air Pollution Measurements, ed. by R. K. Stevens and W. F. Herget (Ann Arbor Science, Ann Arbor 1974) Chap. 10
H. J. Gerritsen: Trans. Am. Inst. Mining Eng. 235, 428 (1966)
A. R. Brenner, S. G. Kukolich: Anal. Lett. 6, 691 (1973)
J. E. Harries: Nature 241, 515 (1973)
see also, B. Carli, D. H. Martin, E. Puplett, J. E. Harries: Nature 257, 649 (1975)
R. L. Byer, M. Garbuny: Appl. Opt. 12, 1496 (1973)
See, for example, S. M. Freund, D. M. Sweger: Anal. Chem. 47, 930 (1975) for a list of early references to the vinyl chloride controversy
See S. C. Wofsy, M. B. Mcelroy, N. D. Sze: Science 187, 535 (1975), and list of references
For recent surveys of laser spectroscopic measurements, see [6.13] or [6.14]
H. Walther (editor): Topics in Applied Physics, Vol. 2: Laser Spectroscopy of Atoms and Molecules. (Springer-Berlin, Heidelberg, New York 1976)
E. D. Hinkley: Opt. Quant. Electron. 8, 155 (1976)
W. Heisenberg: Z. Physik 43, 172 (1927)
R. G. Brewer: Science 178, 247 (1972)
J. L. Hall, C. Bordé: Phys. Rev. Lett. 30, 1101 (1973)
A. S. Pine: J. Mol. Spectrosc. 54, 132 (1975); also personal communication
S. S. Penner: Quantitative Molecular Spectroscopy and Gas Emissivities (Addison Wesley, Reading, Mass. 1959)
K. W. Nill, F. A. Blum, A. R. Calawa, T. C. Harman: Chem. Phys. Lett. 14, 234 (1972)
F. A. Blum, K. W. Nill, A. R. Calawa, T. C. Harman: Chem. Phys. Lett. 15, 144 (1972)
E. D. Hinkley: Phys. Rev. A3, 833 (1971)
K. W. Nill, F. A. Blum, A. R. Calawa, T. C. Harman: Appl. Phys. Lett. 19, 79, (1971)
F. A. Blum, K. W. Nill: Laser Spectroscopy. Proc. Laser Spectroscopy Conf., ed. by R. G. Brewer and A. Mooradian (Plenum Press, New York 1974)
G. P. Montgomery, J. C. Hill: J. Opt. Soc. Am. 65, 579 (1975); also J. C. HILL: personal communication
A. S. Pine: personal communication
K. W. Nill, F. A. Blum: unpublished
P. L. Hanst, A. S. Lefohn, B. W. G, JR.: Appl. Spectrosc. 27, 188 (1973)
E. D. Hinkley: “Development and Application of Tunable Diode Lasers to the Detection and Quantitative Evaluation of Pollutant Gases”, Final Technical Report to the U.S. Environmental Protection Agency (September 1971)
R. S. Mcdowell, H. W. Galbraith, B. J. Krohn, C. D. Cantrell, E. D. Hinkley Opt. Commun. 17,178 (1976)
See, for example [6.19]
F. A. Blum, K. W. Nill, P. L. Kelley, A. R. Calawa, T. C. Harman: Science 177, 694 (1972)
E. D. Hinkley, R. T. Ku: “Diode Laser Multi-Pollutant Ambient Air Monitoring”, Annual Report to the National Science Foundation (RANN) (June 1974)
P. L. Hanst, L. L. Spiller, D. M. Watts, J. W. Spence, M. F. Miller: J. Air Pollution Control Assoc. 25, 1220 (1975)
E. D. Hinkley, R. T. Ku, K. W. Nill, J. F. Butler: Appl. Opt. 15,1653 (1976)
R. L. Byer: “Infrared Differential Absorption for Atmospheric Pollutant Detection”, Report N74-33949, National Aeronautics & Space Admin. (October 1974)
R. T. Ku, E. D. Hinkley, J. O. Sample: Appl. Opt. 14, 854 (1975)
A. S. Pine: J. Opt. Soc. Am. 66, 97 (1976)
H. Inomata, T. Igarashi: Japanese J. Appl. Phys. 14, 1751 (1975)
M. Griggs: J. Chem. Phys. 49, 857 (1968)
R. T. Ku: Unpublished diode laser spectroscopy (1976)
R. T. Thompson, Jr., J. M. Hoell, JR., W. R. Wade: J. Appl. Phys. 46, 3040 (1975)
E. D. Hinkley: “Development of In Situ Prototype Diode Laser System to Monitor SO2Across the Stack”; Final Report to the U.S. Environmental Protection Agency, No. EPA-R2-73-218 (May 1973)
E. D. Hinkley, A. R. Calawa, P. L. Kelley, S. A. Clough: J. Appl. Phys. 43, 3222 (1972)
See L. Trafton: J. Quant. Spectrosc. Radiat. Transf. 13, 821 (1973), and references contained therein
See Ref. [6.19], p. 32
See for example, Topics in Applied Physics, Vol. 1: Dye Lasers F. P. Schäfer, ed. Top. Appl. Phys. 1, (Springer-Berlin, Heidelberg, New York 1973)
J. B. West, R. L. Barger, T. C. English: IEEE/OSA Conf. on Laser Engineering and Applications, Washington, D. C. (May 1975) Paper 5.3
T. W. Hänsch, I. S. Shahin, A. L. Schawlow: Phys. Rev. Lett. 27, 707 (1971)
K. W. Rothe, U. Brinkmann, H. Walther: Appl. Phys. 3, 115 (1974)
W. B. Grant, R. D. Hake, Jr., E. M. Liston, R. C. Robbins, E. K. Procter, Jr.: Appl. Phys. Lett. 24, 550 (1974)
W. B. Grant, R. D. Hake, JR.: J. Appl. Phys. 46, 3019 (1975)
M. R. Bowman, A. J. Gibson, M. C. W. Sandford: Nature 221, 456 (1969)
A. J. Gibson, M. C. W. Sandford: J. Atmos. Terrest. Phys. 33, 1675 (1971)
F. Felix, W. Keenliside, G. Kent, M. C. W. Sandford: Nature 246, 345 (1973)
C. F. Dewey, JR., L. O. Hocker: Appl. Phys. Lett. 18, 58 (1971)
A. S. Pine: J. Opt. Soc. Am. 64, 1683 (1974)
D. S. Chemla, P. J. Kupeck, D. S. Robertson, R. C. Smith: Opt. Commun. 3, 29 (1971)
R. L. Byer, H. Kildal, R. S. Feigelson: Appl. Phys. Lett. 19, 237 (1971)
G. D. Boyd, E. Buehler, F. G. Storz, J. H. Wernick: IEEE J. QE-8, 419 (1972)
G. D. Boyd, H. M. Kasper, J. H. Mcfee, F. G. Storz: IEEE J. QE-8, 900 (1972)
H. Kildal, J. C. Mikkelsen: Opt. Commun. 9, 315 (1973)
H. Kildal, J. C. Mikkelsen: Opt. Commun. 10, 306 (1974)
A. H. M. Ross: (unpublished calculation)
V. J. Corcoran, R. E. Cupp, J. J. Gallagher, W. T. Smith: Appl. Phys. Lett. 16, 316 (1970)
V. J. Corcoran, J. M. Martin, W.T. Smith: Appl. Phys. Lett. 22, 517 (1973)
E. S. Yeung, C. B. Moore: J. Am. Chem. Soc. 93, 2059 (1971)
D. J. Bradley, J. V. Nicholas, J. R. D. Shaw: Appl. Phys. Lett. 19, 172 (1971)
S. E. Harris, D. M. Bloom: Appl. Phys. Lett. 24, 229 (1974)
J. J. Wynne, P. P. Sorokin, J. R. Lankard: In Laser Spectroscopy, ed by. R. G. Brewer and A. MOoradian (Plenum, New York 1974) p. 103
S. E. Harris: Proc. IEEE 57, 2096 (1969)
R. G. Smith: In Laser Handbook, ed. by F. T. Arrechi and E. O. Schultz-Dubois (North-Holland Publ. Co., Amsterdam 1972)
E. O. Ammann, J. M. Yarborough, M. K. Oshman, P. C. Montgomery: Appl. Phys. Lett. 16, 309 (1970)
R. L. Herbst, R. L. Byer: Appl. Phys. Lett. 19, 527 (1971)
R. L. Byer: Digest of Technical Papers, 7th Intern. Quantum Electronics Conf. Montreal, (May 1972)
J. Pinnard, J. F. Young: Opt. Commun. 4, 425 (1972)
Chromatix Corporation, Mountain View, California has developed an OPO with a similar linewidth
T. Hennigsen, M. Garbuny, R. L. Byer: Appl. Phys. Lett. 24, 242 (1974)
M. I. Nathan: Proc. IEEE 54, 1276 (1966)
H. Kressel: In Lasers, Vol. 3, ed. by A. K. Levine and A. J. Demaria (Marcel Dekker, New York 1971) p. 1
T. C. Harman: In The Physics of Semimetals and Narrow-Gap Semiconductors Pergamon Press, New York 1970) p. 363
I. Melngailis, A. Mooradian: In Laser Applications to Optics and Spectroscopy, ed. by S. F. Jacobs, M. Sargent, J. F. Scott, and M. O. Scully (Addison-Wesley, Reading, Mass. 1975) p. 1
E. D. Hinkley, T. C. Harman, C. Freed: Appl. Phys. Lett. 13, 49 (1968)
T. C. Harman, A. R. Calawa, I. Melngailis, J. O. Dimmock: Appl. Phys. Lett. 14, 333 (1969)
J. F. Butler, A. R. Calawa: In Physics of Quantum Electronics, ed. by P. L. Kelley, B. Lax, and P. E. Tannenwald, (McGraw-Hill, New York 1966) p. 458
A. R. Calawa, J. O. Dimmock, T. C. Harman, I. Melngailis: Phys. Rev. Lett. 23, 7 (1969); K. W. NILL, F. A. BLUM, A. R. CALAWA, T. C. HARMAN: J. Nonmetals 1, 211 (1973)
J. M. Besson, J. F. Butler, A. R. Calawa, W. Paul, R. H. Rediker: Appl. Phys. Lett. 7, 206 (1965)
J. M. Besson, W. Paul, A. R. Calawa: Phys. Rev. 173, 699 (1968)
A. S. Pine, C. J. Glassbrenner, J. A. Kafalas: IEEE J. QE-9, 800 (1973)
S. H. Groves, K. W. Nill, A. J. Strauss: Appl. Phys. Lett. 25, 331 (1974)
E. D. Hinkley, C. Freed: Phys. Rev. Lett. 23, 277 (1969)
C. K. N. Patel, E. D. Shaw: Phys. Rev. B 3, 1279 (1971)
A. Mooradian, S. R. J. Brueck, F. A. Blum: Appl. Phys. Lett. 17, 481 (1971)
R. S. Eng, A. Mooradian, H. Fetterman: Appl. Phys. Lett. 25, 453 (1974)
J. P. Sattler, B. A. Weber, J. R. Nemarich: Appl. Phys. Lett. 25, 491 (1974)
P. W. Kruse: Appl. Phys. Lett. 28, 90 (1976)
C. K. N. Patel: Phys. Rev. Lett. 28, 649 (1972)
S. R. J. Brueck, A. Mooradian: IEEE J. QE-10, 634 (1974)
L. B. Kreuzer, C. K. N. Patel: Science 173, 45 (1971)
C. K. N. Patel, E. G. Burkhardt, C. A. Lambert: Science 184, 1173 (1974)
E. G. Burkhardt, C. A. Lambert, C. K. N. Patel: Science 188, 1111 (1975)
A. J. Alcock, K. Leopold, M. C. Richardson: Appl. Phys. Lett. 23, 562 (1973)
J. S. Levine, A. Javan: Appl. Phys. Lett. 22, 55 (1973)
T. Y. Chang, O. R. Wood: Appl. Phys. Lett. 23, 524 (1973); Appl. Phys. Lett. 23, 182 (1974)
H. Kildal, T. F. Deutsch: Appl. Phys. Lett. 27, 500 (1975)
V. N. Bagratashuili, I. N. Knyazev, YU. A. Kudryatsev, V. S. Letokhov: JETP Lett. 18, 62 (1973)
N. W. Harris, F. O'Neill, W. T. Whitney: Appl. Phys. Lett. 25, 148 (1974)
R. L. Abrams: Appl. Phys. Lett. 24, 304 (1974)
P. W. Smith: In Laser Spectroscopy, ed. R. G. Brewer and A. Mooradian (Plenum, New York 1974) p. 247
F.O'Neill, W.T.Whitney: IEEE/OSA Conf. on Laser Engineering and Applications, Washington, D. C. (May 1975) Paper 18.9
For a recent review of infrared detectors for remote sensing, see H. Levinstein, J. Mudar: Proc. IEEE 63, 6 (1975)
See, for example, R. J. Keyes, T. M. Quist: In Semiconductors and Semimetals, ed. by R. K. Willardson and A. C. Beer (Academic Press, New York 1970) Chap. 8
For a review of early spectrophone applications, see M. E. Delany: Sci. Progr. 47, 459 (1959)
L. B. Kreuzer: J. Appl. Phys. 42, 2934 (1971)
P. L. Kelley, R. A. Mcclatchey, R. K. Long, A. Snelson: Opt. Quant. Electron. 8, 117 (1976)
L.-G. Rosengren: Appl. Opt. 14, 1960 (1975)
L.-G. Rosengren: Infrared Phys. 13, 109 (1973)
L.-G. Rosengren, E. Max, S. T. Eng: J. Phys. E (Sci. Inst.) 7, 125 (1974); also L.-G. ROSENGREN: J. Phys. E: Sci. Inst. 8, 242 (1975)
For a recent discussion of interference considerations, see J. Shewchun, B. K. Garside, E. A. Ballik, C. C. Y. Kwan, M. M. Elsherbiny, G. Hogenkamp, and A. Kazandjian: Appl. Opt. 15, 340 (1976)
C. F. Dewey, JR., R. D. Kamm, C. E. Hackett: Appl. Phys. Lett. 23, 633 (1973)
E. Max, L.-G. Rosengren: Opt. Commun. 11, 422 (1974)
R. S. Eng: Solid State Research (M.I.T. Lincoln Laboratory) 4, 36 (1974)
W. Schnell, G. Fischer: Rapport de la Société Suisse de Physique 26, 133 (1975)
P. C. Claspy, Y.-H. Pao, S. Kwong, E. Nodov: IEEE/OSA Conf. Laser Engineering and Applications, Washington, D. C. (1975) Paper 9.10
T. F. Deaton, D. A. Depatie, T. W. Walker: Appl. Phys. Lett. 26, 300 (1975)
P. A. Bonczyk, C. J. Ultee: Opt. Commun. 6, 196 (1972)
A. Kaldor, W. B. Olson, A. G. Maki: Science 176, 508 (1972)
C. Chakerian, JR., M. F. Weisbach: J. Opt, Soc. Am. 63, 342 (1973)
C. F. Dewey, JR.: Optical Eng. 13, 483 (1974)
J. Gelbwachs: Appl. Opt. 13, 1005 (1974)
L. B. Kreuzer, N. D. Kenyon, C. K. N. Patel: Science 177, 347 (1972)
W. Schnell, G. Fischer: Appl. Opt. 14, 2058 (1975); also personal communication
E. D. Hinkley, P. L. Kelley: Science 171, 635 (1971)
E. D. Hinkley: Opto-Electron. 4, 69 (1972)
M. Mumma, T. Kostiuk, S. Cohen, D. Buhl, P. C. Von Thuna: Nature 253, 514 (1975)
R. T. Menzies: U. S. Patent 3,761,715, California Institute of Technology (1971)
E. D. Hinkley: Symp. on Remote Sensing of Environmental Air Pollutants, 1974 Pittsburgh Conf. on Analytical Chemistry and Applied Spectroscopy, Cleveland, Ohio (March 1974)
R.T. Menzies, M. S. Shumate: IEEE/OSA Conf. on Laser Engineering and Applications, Washington, D. C. (1975) Paper 9.2
R. K. Seals, Jr., C. H. Bair: 2nd Joint Conf. on the Sensing of Environmental Pollutants, Washington, D. C. (1973)
Handbook of Military Infrared Technology, ed. by W. L. WOLFE (U. S. Government Printing Office, Cat. 65-62266, 1975)
G. B. Jacobs, L. R. Snowman: IEEE J. QE-3, 603 (1967)
P. L. Hanst: Appl. Spectrosc. 24, 161 (1970)
T. K. Mccubbin, Jr.: Air Force Cambridge Research Laboratory Report No AFCRL 67-0437 (1967)
D. N. Jaynes, B. H. Beam: Appl. Opt. 8, 1741 (1969)
C. Young, R. H. L. Bunner: Appl. Opt. 13, 1438 (1974)
T. Kobayasi, H. Inaba: Opt. Quant. Electron. 7, 319 (1975)
S. S. Penner, K. G. P. Sulzmann, H. K. Chen: J. Quant. Spectrosc. Radiat. Transf. 13, 705 (1973)
J. J. Ball, R. A. Keller: J. Air Poll. Control Assoc. 25, 631 (1975)
E. D. Hinkley, H. A. Pike: unpublished
J. Kuhl, H. Spitschan: Opt. Commun. 13,6 (1975)
J. M. Hoell, Jr., W. R. Wade, R. T. Thompson, Jr.: Intern. Conf. on Environmental Sensing and Assessment, Las Vegas, Nevada (1975) Paper 10-6
F. Allario: Personal communication
D. C. O'Shea, L. G. Dodge: Appl. Opt. 13, 1481 (1974)
L. R. Snowman, R. J. Gillmeister: Joint Conf. on Sensing of Environmental Pollutants, Palo Alto, California (1971) Paper 71–1059
W. A. Mcclenny, R. E. Baumgardner, JR., F. W. Baity, JR., R. A. Gray: J. Air Pollution Control Assoc. 24, 1044 (1974); see also S. E. CRAIG, D. R. MORGAN, D. L. ROBERTS, and L. R. SNOWMAN: “Development of a Gas Laser System to Measure Trace Gases by Long Path Absorption Techniques”; Final Report to the U. S. Environmental Protection Agency, No. EPA-650/2-74-046a, June 1974
R. R. Patty, G. M. Russwurm, W. A. McClenny, and D. R. Morgan: Appl. Opt. 13,2850 (1974)
R. T. Menzies: Appl. Opt. 10, 1532 (1971)
K. Asai, T. Igarashi: Opt. Quant. Electron. 7, 211 (1975)
A.R. Calawa: J. Lumines. 7,477 (1973)
R. T. Ku, E. D. Hinkley,J. O. Sample, L. W. Chaney, W. A. Mcclenny: 68th Annual Meeting of the Air Pollution Control Association, Boston, Mass. (1975) Paper 75-56.5
L. W. Chaney, W. A. McClenny, R. T. Ku: 68th Annual Meeting of the Air Pollution Control Association, Boston, Mass (1975) Paper 75-56.6
F. Allario: EPA Symposium on Long-Path Techniques, Research Triangle Park, North Carolina (February 1975)
B. Christophe, D. Camus: IEEE/OSA Conf. Laser Engineering and Applications, Washington, D. C. (May 1975) Paper 9.1
Z. Kucerovsky, E. Brannen, K. C. Paulekat, D. G. Rumbold: J. Appl. Meteorol. 12, 1387 (1973)
D. H. Ehhalt, L. E. Heidt, R. H. Lueb, N. Roper: Proc. 3rd Conf. on CIAP, ed. by A. J. Broderick and T. M. Hard (U. S. Department of Transportation, Washington, D. C. 1974) pp. 153–160
American National Standard for the Safe Use of Lasers (American National Standards Institute, New York 1973), Z 136.1–1973
see also, “Laser Products,” in Federal Register 39, No. 172, 4 September 1974 (Dept. of Health, Education, and Welfare)
H. G. Häfele: Appl. Phys. 5, 97 (1974/75)
Editor information
Rights and permissions
Copyright information
© 1976 Springer-Verlag
About this chapter
Cite this chapter
Hinkley, E.D., Ku, R.T., Kelley, P.L. (1976). Techniques for detection of molecular pollutants by absorption of laser radiation. In: Hinkley, E.D. (eds) Laser Monitoring of the Atmosphere. Topics in Applied Physics, vol 14. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-07743-X_20
Download citation
DOI: https://doi.org/10.1007/3-540-07743-X_20
Published:
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-07743-5
Online ISBN: 978-3-540-38239-3
eBook Packages: Springer Book Archive