Abstract
This paper addresses the problem of optimal supply and threshold voltage selection with device sizing by minimizing power consumption and maximizing battery charge capacitance using Very Fast Simulated Reannealing (VFSR). We assume that multiple supply voltages and multiple threshold voltage devices are available at gate level. Minimizing power consumption does not necessarily maximize battery charge capacitance. This paper achieves this by implementing both objectives in the cost function.
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© 2005 Springer-Verlag Berlin Heidelberg
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Manzak, A., Goksu, H. (2005). Application of Very Fast Simulated Reannealing (VFSR) to Low Power Design. In: Hämäläinen, T.D., Pimentel, A.D., Takala, J., Vassiliadis, S. (eds) Embedded Computer Systems: Architectures, Modeling, and Simulation. SAMOS 2005. Lecture Notes in Computer Science, vol 3553. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11512622_33
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DOI: https://doi.org/10.1007/11512622_33
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-26969-4
Online ISBN: 978-3-540-31664-0
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