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References
Nelson WB. Accelerated life testing-step-stress models and data analysis. IEEE Trans Reliab 1980;R-29:103–8.
Nelson WB. Applied life data analysis. New York: John Wiley & Sons; 1982.
Nelson WB. Accelerated life testing, statistical models, test plans, and data analysis. New York: John Wiley & Sons; 1990.
Miller RW, Nelson WB. Optimum simple step-stress plans for accelerated life testing. IEEE Trans Reliab 1983; R-32:59–65.
Yin XK, Sheng BZ. Some aspects of accelerated life testing by progressive stress. IEEE Trans Reliab 1987;R-36:150–5.
Mann NR, Schafer RE, Singpurwalla ND. Methods for statistical analysis of reliability and life data. New York: John Wiley & Sons; 1974.
Xiong C. Optimum design on step-stress life testing. In: Proceedings of 1998 Kansas State University Conference on Applied Statistics in Agriculture, 1998; p.214–25.
Lawless JF. Statistical models and methods for lifetime data. New York: John Wiley & Sons; 1982.
Halperin M. Maximum likelihood estimation in truncated samples. Ann Math Stat 1952;23:226–38.
Bai DS, Kim MS, Lee SH. Optimum simple step-stress accelerated life tests with censoring. IEEE Trans Reliab 1989;38:528–32.
Xiong C. Inferences on a simple step-stress model with type II censored exponential data. IEEE Trans Reliab 1998;47:142–6.
Chernoff H. Optimal accelerated life designs for estimation. Technometrics 1962;4:381–408.
Bazaraa MS, Shetty CM. Nonlinear programming: theory and algorithms. New York: John Wiley & Sons; 1979.
Meeker WQ, Nelson WB. Optimum accelerated life tests for Weibull and extreme value distributions and censored data. IEEE Trans Reliab 1975;R-24:321–32.
Yurkowski W, Schafer RE, Finkelstein JM. Accelerated testing technology. Rome Air Development Center Technical Report 67-420, Griffiss AFB, New York, 1967.
Meeker WQ, Escobar LA. A review of recent research and current issues in accelerated testing. Int Stat Rev 1993;61:147–68.
Shaked M, Singpurwalla ND. Inference for step-stress accelerated life tests. J Stat Plan Infer 1983;7:694–99.
Barbosa EP, Colosimo EA, Louzada-Neto F. Accelerated life tests analyzed by a piecewise exponential distribution via generalized linear models. IEEE Trans Reliab 1996;45:619–23.
Tyoskin OI, Krivolapov SY. Nonparametric model for step-stress accelerated life testing. IEEE Trans Reliab 1996;45:346–350.
Schäbe H. Accelerated life testing models for nonhomogeneous Poisson processes. Stat Pap 1998; 39:291–312.
DeGroot MH, Goel PK. Bayesian estimation and optimal designs in partially accelerated life testing. Nav Res Logist Q 1979;26:223–35.
Dorp JR, Mazzuchi TA, Fornell GE, Pollock LR. A Bayes approach to step-stress accelerated life testing. IEEE Trans Reliab 1996;45:491–8.
Khamis IH, Higgins JJ. Optimum 3-step step-stress tests. IEEE Trans Reliab 1996;45:341–5.
Khamis IH, Higgins JJ. A new model for step-stress testing. IEEE Trans Reliab 1998;47:131–4.
Xiong C, Milliken GA. Step-stress life-testing with random stress-change times for exponential data. IEEE Trans Reliab 1999;48:141–8.
Xiong C. Step-stress model with threshold parameter. J Stat Comput Simul 1999;63:349–60.
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Xiong, C. (2003). Step-stress Accelerated Life Testing. In: Pham, H. (eds) Handbook of Reliability Engineering. Springer, London. https://doi.org/10.1007/1-85233-841-5_25
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DOI: https://doi.org/10.1007/1-85233-841-5_25
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