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Gauss’ law of error revisited in the framework of Sharma-Taneja-Mittal information measure

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Central European Journal of Physics

Abstract

We reformulate the Gauss’ law of error in presence of correlations which are taken into account by means of a deformed product arising in the framework of the Sharma-Taneja-Mittal measure. Having reviewed the main proprieties of the generalized product and its related algebra, we derive, according to the Maximum Likelihood Principle, a family of error distributions with an asymptotic power-law behavior.

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Author information

Authors and Affiliations

  1. Dipartimento di Fisica Politecnico di Torino, Istituto Nazionale per la Fisica della Materia (CNR-INFM), I-10129, Torino, Italy

    Antonio M. Scarfone

  2. Graduate School of Advanced Integration Science, Chiba University, 263-8522, Chiba, Japan

    Hiroki Suyari

  3. Department of Electrical and Electronic Engineering, Ibaraki University, 316-8511, Hitachi, Japan

    Tatsuaki Wada

Authors
  1. Antonio M. Scarfone
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  2. Hiroki Suyari
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  3. Tatsuaki Wada
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Corresponding author

Correspondence to Antonio M. Scarfone.

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Scarfone, A.M., Suyari, H. & Wada, T. Gauss’ law of error revisited in the framework of Sharma-Taneja-Mittal information measure. centr.eur.j.phys. 7, 414–420 (2009). https://doi.org/10.2478/s11534-009-0002-3

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  • DOI: https://doi.org/10.2478/s11534-009-0002-3

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