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TXRF Analysis of Solution Samples Using Polyester Film as a Disposable Sample-Carrier Cover

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Abstract

The performance of polyester film was examined as a disposable cover of the sample-carrier (silicon wafer). The cover offers convenience and economy for the total reflection X-ray fluorescence (TXRF) analysis of solution samples. Moreover, the measurement of Al Kα (1.487 keV) and P Kα (2.013 keV) peaks is possible because of the reduction of Si Kα X-rays (1.740 keV) from the sample-carrier. Not only the trace elements (Cr, Mn, Co, Ni and Cu) but also the low sensitivity elements (Al and P) in JSS iron and steel standard samples were successfully analyzed.

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Authors and Affiliations

  1. National Research Institute for Metals, Sengen, Tsukuba, Ibaraki, 305-0047, Japan

    Hitoshi Yamaguchi, Shinji Itoh & Ryosuke Hasegawa

  2. Department of Materials Science, Faculty of Engineering, Ibaraki University, Nakanarusawa, Hitachi, Ibaraki, 316-8511, Japan

    Shukuro Igarashi & Kunishige Naitoh

Authors
  1. Hitoshi Yamaguchi
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  2. Shinji Itoh
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  3. Shukuro Igarashi
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  4. Kunishige Naitoh
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  5. Ryosuke Hasegawa
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Yamaguchi, H., Itoh, S., Igarashi, S. et al. TXRF Analysis of Solution Samples Using Polyester Film as a Disposable Sample-Carrier Cover. ANAL. SCI. 14, 909–912 (1998). https://doi.org/10.2116/analsci.14.909

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  • DOI: https://doi.org/10.2116/analsci.14.909

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