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Methodological Approaches to Research of Multilayer Thin-Film Systems and Interfaces in Composite Materials

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Abstract

The adhesive strength of the fiber–matrix bond has been experimentally determined by the method of pushing out fibers with an indenter, the structure of carbon fibers has been studied by scanning and high-resolution transmission electron microscopies, and some methodological approaches to the investigation of the structure and geometric characteristics of multilayer coatings (by a set of methods, including X-ray reflectometry, atomic force microscopy (AFM), and high-resolution transmission electron microscopy (HRTEM)) are considered.

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Funding

This study was supported by the Russian Foundation for Basic Research, project no. 19-29-03055, in the part concerning the investigations of Ti films with an amorphous SiO2 sublayer on a silicon single-crystal substrate.

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Authors and Affiliations

  1. All-Russian Scientific Research Institute of Aviation Materials, 105005, Moscow, Russia

    E. A. Lukina, A. I. Gulyaev, P. L. Zhuravleva & D. V. Zaitsev

Authors
  1. E. A. Lukina
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  2. A. I. Gulyaev
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  3. P. L. Zhuravleva
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  4. D. V. Zaitsev
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Corresponding author

Correspondence to E. A. Lukina.

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Translated by A. Sin’kov

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Lukina, E.A., Gulyaev, A.I., Zhuravleva, P.L. et al. Methodological Approaches to Research of Multilayer Thin-Film Systems and Interfaces in Composite Materials. Crystallogr. Rep. 66, 618–624 (2021). https://doi.org/10.1134/S106377452104012X

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  • DOI: https://doi.org/10.1134/S106377452104012X

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