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Mapping quantitative trait loci for flag leaf senescence as a yield determinant in winter wheat under optimal and drought-stressed environments

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Abstract

The timing of flag leaf senescence (FLS) is an important determinant of yield under stress and optimal environments. A doubled haploid population derived from crossing the photo period-sensitive variety Beaver,with the photo period-insensitive variety Soissons, varied significantly for this trait, measured as the percent green flag leaf area remaining at 14 days and 35 days after anthesis. This trait also showed a significantly positive correlation with yield under variable environmental regimes. QTL analysis based on a genetic map derived from 48 doubled haploid lines using amplified fragment length polymorphism (AFLP) and simple sequence repeat (SSR) markers, revealed the genetic control of this trait. The coincidence of QTL for senescence on chromosomes 2B and 2D under drought-stressed and optimal environments, respectively, indicate a complex genetic mechanism of this trait involving the re-mobilisation of resources from the source to the sink during senescence.

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Author notes

  1. P.D.S. Caligari

    Present address: Instituto de Biologia Vegetal y Biotecnologia, Universidad de Talca, 2 Norte 685, Talca, Chile

Authors and Affiliations

  1. John Innes Centre, Norwich Research Park, Colney, Norwich, NR4 7UH, U.K

    V. Verma & J.W. Snape

  2. Division of Agricultural Sciences, School of Biosciences, University of Nottingham, Loughborough, Leics, LE12 5RD, U.K

    M.J. Foulkes

  3. School of Plant Science, University of Reading, Reading, RG6 6AS, U.K

    R. Sylvester-Bradley & P.D.S. Caligari

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  1. V. Verma
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  2. M.J. Foulkes
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  3. A.J. Worland
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  4. R. Sylvester-Bradley
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  5. P.D.S. Caligari
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Correspondence to J.W. Snape.

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Verma, V., Foulkes, M., Worland, A. et al. Mapping quantitative trait loci for flag leaf senescence as a yield determinant in winter wheat under optimal and drought-stressed environments. Euphytica 135, 255–263 (2004). https://doi.org/10.1023/B:EUPH.0000013255.31618.14

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  • DOI: https://doi.org/10.1023/B:EUPH.0000013255.31618.14

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