Abstract
The interrupting capability of a gas-blast high-voltage circuit breaker (CB) is mainly determined by the self-induced pressure rise caused by the thermal arc energy, the composition of the arc plasma and the chemical reactions occuring during and after current interruption. We have studied the nozzle materials boron nitride (BN), quartz (SiO2), polytetrafluoroethylene (PTFE), ethylene-tetrafluoroethylene (ETFE), polyethylene (PE) and epoxy resin (ER) with respect to their influence on these processes with the aid of a model circuit breaker (MCB). Direct measurements of the arc-induced pressure rise reveal that the portion of the arc energy available for the pressure rise varies greatly (∼20%–65%) with the properties of the nozzle material. Nozzle erosion is significantly higher for materials with high values (e.g. polymers). Therefore, the lifetime of polymer nozzles is considerably shorter than that of ceramic nozzles. We have investigated the influence of the nozzle material on the decomposition products formed in the arc discharge of our MCB by studying the composition and time dependence of these products. The MCB was directly attached to the time-of-flight mass spectrometer (TOFMS) with the aid of a molecular-beam sampling system, which allowed real-time measurements of the arced gas during and after current interruption, thus providing information on the ablation mechanism and on the reaction kinetics of vaporised nozzle material with dissociated SF6. The most abundant long-lived reaction products are SF4, SOF2, C2H2, CO, and CS2. Their formation rates have been determined as functions of the nozzle material. With respect to quantities and properties of decomposition products, ceramics are superior to polymers since they form only small concentrations of corrosive and toxic products.
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References
W. Mosch, W. Hauschild, M. Kahle: InHochspannungsisolierungen mit Schwefelhexafluorid, ed. by M. Kahle (VEB Verlag Technik, Berlin 1979)
W. Hertz, H. Motschmann, H. Wittel: Proc. IEEE59, 485 (1971)
R. Meier, F.K. Kneubühl, R. Coccioni, H. Wyss, E. Fischer, H.J. Schötzau: IEEE Trans. PS-14, 390 (1986)
G. Frind, R.E. Kinsinger, E.D. Miller, H.T. Nagamatsu, H.O. Noeske: Final Rep. EPRI EL-284 General Electric, Schenectady, NY (1977)
K. Ragaller, K. Reichert: InCurrent Interruption in High-Voltage Networks, ed. by K. Ragaller (Plenum, New York 1978) pp. 1–28
W. Rüegsegger, F.K. Kneubühl, H.J. Schötzau: Appl. Phys. B31, 9 (1983)
W. Rüegsegger, R. Meier, F.K. Kneubühl, H.J. Schötzau: Appl. Phys. B37, 115 (1985)
G.N. Glasoe, J.V. Lebacoz:Pulse Generators (Boston Technical, Lexington, MA 1964)
A. Kantrowitz, J. Grey: Rev. Sci. Instrum.22, 328 (1951)
J.B. Anderson, R.P. Andres, J.B. Fenn: InMolecular Beams, ed. by J. Ross (Wiley, New York 1966) pp. 275–317
J.B. French: AIAA J.3, 993 (1965)
E.L. Knuth: Appl. Mech. Rev.17, 751 (1964)
W.J. McLean: Ph.D. Thesis, Report TS-71-7, University of California, Berkeley (1971)
K. Bier, O. Hagena: InRarefied Gas Dynamics, Proc. of 3rd Intl. Symp., ed. by J.H. Laurmann (Academic, New York 1963) pp. 478–496
H. Ashkenas, F.S. Shermann: InRarefied Gas Dynamics, Proc. of 4th Intl. Symp., ed. by H. DeLeeuw (Academic New York 1966) pp. 84–105
W. Frie: Z. Phys.201, 269–294 (1967)
F.Y. Chu, C.K. Law: Proc. 6th Intl. Conf. on Gas Discharges and Their Applications, Edinburgh, Sept. 1980 (IEE, London 1980) p. 266
H. Motschmann: Siemens Forsch. Entwicklungsber.5, 278 (1976)
D.C. Strachan, D. Lidgate, G.R. Jones: J. Appl. Phys48, 2324 (1977)
J.L. Leclerc, G.R. Jones: Proc. 7th Intl. Conf. on Gas Discharges and Their Applications, London, Sept. 1982 (Peregrinus, London 1982) p. 1
L.D. Landau, E.U. Lifshitz:Fluid Mechanics, Course of Theoretical Physics, Vol. 6 (Pergamon, New York 1979)
W.M. Rohsenow, J.P. Hartnett:Handbook of Heat Transfer (McGraw-Hill, New York 1973)
C.B. Ruchti, L. Niemeyer: IEEE Trans. PS-14, 423 (1986)
J.J. Lowke: InCurrent Interruption in High-Voltage Networks, ed. by K. Ragaller (Plenum, New York 1977) pp. 299–328
P. Kovitya, J.J. Lowke: J. Phys. D17, 1197 (1984)
H.P. Graf, H.P. Meili, E. Fischer, H.J. Schötzau: Appl. Phys. B36, 33–40 (1985)
H.J. Schötzau, H.P. Meili, E. Fischer, Ch. Sturzenegger, H.P. Graf: IEEE PES SM 647-4 (1984)
R. Lincke: InPlasma Diagnostics, ed. by W. Lochte-Holtgreven (North-Holland, Amsterdam 1968) pp. 347–423
W. Schnabel:Polymer Degradation (Hanser, München 1981)
H.R. Philipp, H.S. Cole, Y.S. Lin, T.A. Sitnik: Appl. Phys. Lett.48, 192–194 (1986)
F.M. Clark:Insulating Materials for Design and Engineering Practice (Wiley, New York 1962)
R.C. Weast (ed.):Handbook of Chemistry and Physics, 57th ed. (CRC, Cleveland, OH 1976)
Y.S. Touloukian:Thermophysical Properties of Matter, TPRC Data Series, Vol. 2/5 (IFI Plenum, New York 1970)
G.R. Jones, N.Y. Shammas, A.N. Prasad: IEEE Trans. PS-14, 413 (1986)
J.J. Lowke, H.C. Ludwig: J. Appl. Phys.46, 3352 (1975)
L. Niemeyer: IEEE Trans. PAS-97, 950 (1978)
P. Kovitya: IEEE Trans. PS-12, 38 (1984)
EPRI Report EL-2620 (Sept. 1982)
A. Lee, L.S. Frost: IEEE Trans. PS-8, 362–367 (1980)
N.V. Steere:CRC Handbook of Laboratory Safety, 2nd ed. (CRC, Cleveland, OH 1971)
I. Sauer, F.Y. Chu, W.G. Dreibelbis, G.D. Griffin, R.H. Knight, R.J. Van Brunt: InGaseous Dielectrics IV, Proc. 4th Intl. Symp. Gaseous Dielectrics (Pergamon, New York 1984) pp. 580–594
R.J. Van Brunt: J. Res. Natl. Bur. Stand.90, 229 (1985)
C. Boudène, J.L. Cluet, G. Keib, G. Wind: Rev. Gen. Electr., special issue, 45–78 (1974)
T. Nitta, Y. Shibuya, Y. Fujiwara, Y. Arahata H. Takahashi, H. Kuwahara: IEEE Trans. PAS-97, 959 (1978)
H. Latour-Slowikowska, J. Lampe, J. Slowikowski: InGaseous Dielectrics IV, Proc. 4th Intl. Symp. Gaseous Dielectrics (Pergamon, New York 1984) pp. 286–291
I. Sauers, H.W. Ellis, L.C. Frees, L.G. Christophorou: IEEE Trans. EI-17, 284 (1982)
W. Rüegsegger, R. Meier, H.J. Schötzau, F.K. Kneubühl: Helv. Phys. Acta57, 521 (1984)
R. Gilbert, J. Castonguay, A. Théorêt: J. Appl. Polym. Sci.24, 125–133 (1979)
D.E. Cooper, M. Farber, S.P. Harris: In Annual Report of the Conf. on Electr. Insul. and Dielectric Phenomena (IEEE, New York 1984) pp. 32–37
J.P. Manion, J.A. Philosophos, M.B. Robinson: IEEE Trans. EI-2, 1–10 (1967)
S. Tominaga, H. Kuwahara, K. Horooka: IEEE Trans. PAS-98, 2107 (1979)
F.Y. Chu, H.A. Stuckless, J.M. Braun: InGaseous Dielectrics IV, Proc. 4th Intl. Symp. Gaseous Dielectrics (Pergamon, New York 1984) pp. 462–472
S. Tokuyama, Y. Yoshioka, F. Nakazima, Y. Arikawa: Proc. 2nd Intl. Conf. on Gas Discharges and Their Applications, London, Sept. 1972 (IEE, London 1972) pp. 200–205
W. Becher, J. Massonne Elektrotech. Z. A91, 605 (1970)
W. Habermann, M. Lindmeyer: Calor-Emag-Mitt. H1/2, 330–334 (1969)
G. Jackson, L. Hatfield, G. Leiker, M. Kristiansen, M. Hagler, A. Donaldson, R. Curry, R. Ness, J. Marx, L. Gordon, D. Johnson: Proc. 4th Intl. Pulsed Power Conf. (IEEE, New York 1983) pp. 687–690
E. Pfender: InGaseous Electronics, ed. by N.M. Hirsh, H.J. Oskam (Academic, New York 1978) pp. 291–398
M.T.C. Fang, D.B. Newland: J. Phys. D16, 793–810 (1983)
T.H. Lee: Proc. IEEE57, 307–323 (1969)
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Meier, R., Kneubühl, F.K. & Schötzau, H.J. Mass-spectroscopic study of the influence of nozzle material on high-pressure SF6 arcs. Appl. Phys. B 48, 187–211 (1989). https://doi.org/10.1007/BF00694346
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DOI: https://doi.org/10.1007/BF00694346