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In-Situ Optical TEM

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In-Situ Transmission Electron Microscopy

Abstract

Functional materials with various photoresponse performances have attracted much attention for their irreplaceable role in key fields such as clean energy, communications, and pollution disposal. The ability of in situ characterizing the dynamic behavior under light illumination would provide an in-depth understanding of structure–property relationships, which is essential for further improvements. In the past few decades, specialized TEMs, TEM holders as well as MEMS chips have been developed to realize in situ stimulation and detection of light signals and related physical responses of TEM sample. These significant technical progresses have promoted the investigation of functional materials and devices. This chapter focuses on the basic technique principles and implementations of three typical routes in present in situ optical TEM, including integration of light-paths inside TEMs or holders, modification of TEM-STM holders, and development of optical MEMS chips. Several application cases based on the associated methods are reviewed to demonstrate the design and operation of in situ optical experiments.

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Authors and Affiliations

  1. National Laboratory of Solid State Microstructures, Jiangsu Key Laboratory of Artificial Functional Materials, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, 210093, China

    Peng Wang

  2. SEU-FEI Nano-Pico Center, Key Laboratory of MEMS of Ministry of Education, Southeast University, Nanjing, 210096, China

    Feng Xu

  3. International Center for Quantum Materials, and Electron Microscopy Laboratory, School of Physics, Peking University, Beijing, 100871, China

    Peng Gao

  4. Department of Applied Physics, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, 999077, China

    Songhua Cai

  5. Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, China

    Xuedong Bai

Authors
  1. Peng Wang
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  2. Feng Xu
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  3. Peng Gao
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  4. Songhua Cai
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  5. Xuedong Bai
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Corresponding author

Correspondence to Peng Wang .

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Editors and Affiliations

  1. School of Electronic Science and Engineering, Southeast University, Nanjing, Jiangsu, China

    Litao Sun

  2. School of Electronic Science and Engineering, Southeast University, Nanjing, Jiangsu, China

    Tao Xu

  3. School of Materials Science and Engineering, Zhejiang University, Hangzhou, Zhejiang, China

    Ze Zhang

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Wang, P., Xu, F., Gao, P., Cai, S., Bai, X. (2023). In-Situ Optical TEM. In: Sun, L., Xu, T., Zhang, Z. (eds) In-Situ Transmission Electron Microscopy. Springer, Singapore. https://doi.org/10.1007/978-981-19-6845-7_6

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