Abstract
The present studies on a-Si:H films suggest that the density of the source for the light-induced defects has the limited value for respective a-Si:H films and the a-Si:H solar cells stabilize after an initial light-induced degradation. Field testing results indicate that degradation of a-Si:H modules can be suppressed within 10% of the original efficiency after 2 years operation. It is also indicated that the multifunction cells are more stable to light exposure than single p-i-n cells.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Y. Uchida and H. Sakai, Proc. MRS Spring Meeting, Palo Alto, 1986 (to be published).
H. Sakai, Y. Ichikawa, K. Maruyama, T. Yoshida, N. Itoh, M. Kamiyama and Y. Uchida, Proc. 2nd Int. PVSEC, Beijing, 1986, p. 390.
Y. Uchida, M. Nishiura, H. Sakai and H. Haruki, Solar Cells, 9, 3 (1983).
D. L. Staebler and C. R. Wronski, Appl. Phys, Lett., 31, 292 (1977).
M. Ohsawa, T. Hama, T. Ichimura, T. Akasaka, H. Sakai, S. Ishida and Y. Uchida, J.Non-Cryst. Solids, 77&78, 401–404 (1985).
M. Ohsawa, T. Hama, T. Akasaka, T. Ichimura, H. Sakai, S. Ishida and Y. Uchida, Jpn. J. Appl. Phys., 24, L838 (1985)
E. Eser, J. Appl. Phys., 59, 3502 (1986).
T. Hama et al. (to be published).
K. Takigawa, Y. Takeda and H. Kobayashi, Tech. Digest of the Int PVSEC-1, Kobe, 1984, p. 233.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1987 ECSC, EEC, EAEC, Brussels and Luxembourg
About this paper
Cite this paper
Uchida, Y. (1987). Light-Induced Degradation in Amorphous Silicon Solar Cells. In: Goetzberger, A., Palz, W., Willeke, G. (eds) Seventh E.C. Photovoltaic Solar Energy Conference. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-3817-5_71
Download citation
DOI: https://doi.org/10.1007/978-94-009-3817-5_71
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-010-8198-6
Online ISBN: 978-94-009-3817-5
eBook Packages: Springer Book Archive