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Dynamic AFM in Liquids: Viscous Damping and Applications to the Study of Confined Liquids

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Applied Scanning Probe Methods XII

Part of the book series: NanoScience and Technology ((NANO))

Abstract

We present a study of dynamic atomic force microscopy (AFM) in liquid medium. In the first part, we investigate hydrodynamic viscous damping. Using an experimental analysis of the thermal noise motion of the cantilever, the dependency of the hydrodynamic damping versus the cantilever–surface separation was evaluated. In the second part, we present an improvement of the excitation holder that allows us to remove the spurious peaks not corresponding to the resonance frequency of the cantilever mechanical response. An analytical description of the motion of an acoustic-driven cantilever in liquid is given in the third part. \quad In the last part, we have used dynamic AFM to study a simple liquid confined between the cantilever tip and a graphite surface. The results show that the liquid undergoes ordering to layers with a characteristic size given by the molecular diameter.

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Author information

Authors and Affiliations

  1. CPMOH, Université Bordeaux1, 351 Cours de la Libération, 33405 Talence Cedex, France

    Abdelhamid Maali, Touria Cohen-Bouhacina, Cedric Hurth, Cédric Jai, R. Boisgard & Jean-Pierre Aimé

Authors
  1. Abdelhamid Maali
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  2. Touria Cohen-Bouhacina
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  3. Cedric Hurth
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  4. Cédric Jai
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  5. R. Boisgard
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  6. Jean-Pierre Aimé
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Editor information

Editors and Affiliations

  1. Nanoprobe Laboratory for Bio- & Nanotechnology & Biomimetics (NLB2), Ohio State University, 201 W. 19th Ave, Columbus, Ohio 43210-1142, USA

    Bharat Bhushan

  2. Universität Münster FB 16 Physikalisches Institut, Wilhelm-Klemm-Str. 10, 48149 Münster, Germany

    Harald Fuchs

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© 2009 Springer-Verlag Berlin Heidelberg

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Maali, A., Cohen-Bouhacina, T., Hurth, C., Jai, C., Boisgard, R., Aimé, JP. (2009). Dynamic AFM in Liquids: Viscous Damping and Applications to the Study of Confined Liquids. In: Bhushan, B., Fuchs, H. (eds) Applied Scanning Probe Methods XII. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-85039-7_7

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