Abstract
Uncontrolled fabrication errors for multilayer porous silicon structures could in some circumstances significantly and unexpectedly change their optical properties (reflectivity, refractive index, etc.). Therefore, optical characterization of these structures gains prominent importance before using these structures for various applications such as optoelectronics and sensing. It is the aim of this short review to discuss the importance of optical characterization of multilayer porous silicon structures, by way of some numerical modeling and experimental results. We will thereby illustrate some important aspects about how the optical performance of these structures can be increased by following some simple precautions in their fabrication. It is also our objective in this review to bring some of the recent studies and trends in the subject of optical characterization to the attention of readers.
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Hasar, U.C., Ozbek, I.Y., Karacali, T. (2017). Optical Characterization of Porous Silicon Multilayers. In: Canham, L. (eds) Handbook of Porous Silicon. Springer, Cham. https://doi.org/10.1007/978-3-319-04508-5_118-1
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DOI: https://doi.org/10.1007/978-3-319-04508-5_118-1
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