Abstract
This chapter is structured into two main parts. Part 1 describes the fundamentals of the atomic (ideal) structure and (real) microstructure arrangement of solid matter. The way in which (metallic) materials are generated from the melt and the resulting phase diagrams for common binary systems are elucidated in the first part of this chapter (Sect. 4.1). In order to understand materials properties, microstructural characterization has to be carried out on various length scales. Therefore, in the second part (Sect. 4.2), the most common preparation steps for microscopy methods used in materialography are given. Next, basic micromethods for the investigation of the local chemical composition and local crystalline structure are outlined. This includes methodologies for the quantification of the complex microstructures in engineering materials.
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References
R.W. Cahn, P. Haasen, E.J. Kramer: Materials science and technology. In: Glasses and Amorphous Materials, Vol. 9, ed. by J. Zarzycki (Wiley-VCH, Weinheim 2005)
A. Inoue, T. Zhang, T. Masumoto: Production of amorphous cylinder and sheet of La55Al25Ni20 alloy by a metallic mold casting method, Mater. Trans. 31, 425–428 (1990)
A. Peker, W.L. Johnson: A highly processable metallic glass: Zr41.2Ti13.8Cu12.5Ni10.0Be22.5, Appl. Phys. Lett. 63, 2342 (1993)
A. Leonhard, L.Q. Xing, M. Heilmaier, A. Gebert, J. Eckert, L. Schultz: Effect of crystalline precipitations on the mechanical behavior of bulk glass forming Zr-based alloys, Nanostruct. Mater. 10, 805–817 (1998)
A. Inoue: Stabilization of metallic supercooled liquid and bulk amorphous alloys, Acta Mater 48, 279–306 (2000)
C. Kittel: Introduction to Solid State Physics, 8th edn. (Wiley, Chichester 2004)
R.W. Cahn, P. Haasen: Physical Metallurgy, 4th edn. (North Holland, Amsterdam 1996)
R. Tilley: Crystals and Crystal Structures (Wiley, Chichester 2006)
D.A. Porter, K.E. Easterling: Phase Transformations in Metals and Alloys, 2nd edn. (Chapman Hall, London 1997)
D.B. Williams, C.B. Carter: Transmission Electron Microscopy (Plenum, New York 1996)
G.E. Dieter: Mechanical Metallurgy, SI Metric Edition (McGraw-Hill, London 1988)
E.O. Hall: The deformation and aging of mild steel: III Discussion of results, Proc. R. Soc. B 64, 747–752 (1951)
N.J. Petch: The cleavage strength of polycrystals, J. Iron Steel Inst. 174, 25 (1953)
J. Gurland: Correlation between yield strength and microstructure of some carbon steels. In: Stereology and Quantitative Metallography, ed. by G. Pellissier, S. Purdy (ASTM International, West Conshohocken 1972) pp. 108–118
B. Reppich: Particle strengthening. In: Plastic Deformation and Fracture of Materials, Materials Science and Technology, Vol. 6, ed. by R.W. Cahn, P. Haasen, E.J. Kramer (Wiley-VCH, Weinheim 1993) pp. 312–357
R.J. Silbey, R.A. Alberty, M.G. Bawendi: Physical Chemistry, 4th edn. (Wiley, Hoboken 2005)
H.E. Exner, M. Rettenmayr, C. Müller: Komplexe Grenzflächengeometrien bei Phasenumwandlungen, Prakt. Metallogr. 41, 443–458 (2004)
V.K. Pecharsky, P. Zavalij: Fundamentals of Powder Diffraction and Structural Characterization of Materials (Kluwer, Dordrecht 2003)
D.J. Dyson: X-ray and Electron Diffraction Studies in Materials Science (Maney, London 2004)
F.H. Chung, D.K. Smith: Industrial Applications of X-ray Diffraction (Dekker, New York 1999)
M. Howes, T. Inoue, G.E. Totten: Handbook of Residual Stress and Deformation of Steel (ASM International, Materials Park 2002)
V. Randle, O. Engler: Introduction to Texture Analysis (Gordon Breach, Amsterdam 2000)
H.J. Bunge: Texture Analysis in Materials Science, Mathematical Methods (Butterworth-Heinemann, London 1982)
G.F. Vander Voort: ASM Handbook: Metallography and Microstructures (ASM International, Materials Park 2004)
B. Bousfield: Surface Preparation and Microscopy of Materials (Wiley, Chichester 1992)
G. Petzow, V. Carle: Metallographic Etching (ASM International, Materials Park 1999)
H.G. Michler: Electron Microscopy of Polymers (Springer, Berlin, Heidelberg 2008)
L. Reimer: Scanning Electron Microscopy. Physics of Image Formation and Microanalysis (Springer, Berlin 1998)
J.I. Goldstein, D.E. Newbury, P. Echlin, D.C. Joy, C. Fiori, E. Lifshin: Scanning Electron Microscopy and X-ray Microanalysis (Plenum, New York 1992)
W. Hauffe: Production of microstructures by ion beam sputtering. In: Sputtering by Particle Bombardment III, Topics in Applied Physics, Vol. 64, ed. by R. Behrisch, K. Wittmaack (Springer, Berlin, Heidelberg 1991) pp. 305–338
L.A. Giannuzzi, F.A. Stevie: Introduction to Focused Ion Beams (Springer, New York 2004)
B.W. Kempshall, S.M. Schwarz, B.I. Prenitzer, L.A. Giannuzzi, R.B. Irwin, F.A. Stevie: Ion channeling effects on the focused ion beam milling of Cu, J. Vac. Sci. Technol. B 19, 749–754 (2001)
L. Reimer: Transmission Electron Microscopy. Physics of Image Formation and Microanalysis (Springer, Berlin 2006)
C.C. Ahn, M.M. Disko, B. Fultz: Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas (Wiley-VCH, Weinheim 2004)
J.P. Eberhart: Structural and Chemical Analysis of Materials (Wiley, Chichester 1991)
V.D. Scott, G. Love, S.J.B. Reed: Quantitative Electron Probe Microanalysis (Ellis Horwood, New York 1995)
A.J. Schwartz, M. Kumar, B.L. Adams: Electron Backscatter Diffraction in Materials Science (Kluwer, New York 2000)
D.J. Dingley, K.Z. Baba-Kishi, V. Randle: Atlas of Backscattering Kikuchi Diffraction Patterns (IOP, Bristol 1995)
D. Katrakova, F. Mücklich: Specimen preparation for electron backscatter diffraction. Part I: Metals, Prakt. Metallogr. 38, 547–565 (2001)
D. Katrakova, F. Mücklich: Specimen preparation for electron backscatter diffraction. Part II: Ceramics, Prakt. Metallogr. 39, 644–662 (2002)
R.P. Goehner, J.R. Michael: Phase identification in a scanning electron microscope using backscattered electron Kikuchi patterns, J. Res. Natl. Inst. Stand. Technol. 101, 301–308 (1996)
R.A. Schwarzer, A. Huot: The study of microstructure on a mesoscale by ACOM, Cryst. Res. Technol. 35, 851–862 (2000)
E.E. Underwood: Quantitative Stereology (Addison-Wesley, Reading 1970)
J. Ohser, F. Mücklich: Statistical Analysis of Microstructures in Materials Science (Wiley, Chichester 2000)
H.E. Exner: Quantitative description of microstructures by image analysis. In: Characterization of Materials (Part II), Materials Science and Technology, Vol. 2B, ed. by R.W. Cahn, P. Haasen, E.J. Kramer (VCH, Weinheim 1994) pp. 281–350
E.E. Underwood: Quantitative metallography. In: Metallography and Microstructures, 9th edn., Metals Handbook, Vol. 9, ed. by K. Mills (ASM, Materials Park 1985) pp. 123–134
ISO: ISO 9042:1988: Steel – Manual Point Counting Method for Statistically Estimating the Volume Fraction of a Constituent with a Point Grid (ISO, Geneva 1988)
ISO: ISO 14250:2000 Steel – Metallographic Characterization of Duplex Grain Size and Distributions (ISO, Geneva 2000)
ASTM: ASTM E1245-03: Standard Practice for Determining the Inclusion or Second-Phase Constituent Content of Metals by Automatic Image Analysis (ASTM International, West Conshohocken 2003)
ISO: ISO 945:1975: Cast Iron – Designation of Microstructure of Graphite (ISO, Geneva 1975)
ISO: ISO 2624:1990: Copper and Copper Alloys – Estimation of Average Grain Size (ISO, Geneva 1990)
ASTM: ASTM E112-96(2004): Standard Test Methods for Determining Average Grain Size (ASTM International, West Conshohocken 2004)
ISO: ISO 643-2003: Steels – Micrographic Determination of the Apparent Grain Size (ISO, Geneva 2003)
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Freudenberger, J., Heilmaier, M., Wendt, U. (2021). Atomic Structure and Microstructure Characterization. In: Grote, KH., Hefazi, H. (eds) Springer Handbook of Mechanical Engineering. Springer Handbooks. Springer, Cham. https://doi.org/10.1007/978-3-030-47035-7_4
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DOI: https://doi.org/10.1007/978-3-030-47035-7_4
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