Abstract
Inelastic scattering of light—or Raman scattering—from elementary excitations in a material yields structural and dynamic information on a molecular level. The Raman spectrum can be analyzed in terms of the molecular components or functional groups thus providing a “fingerprint” of the molecule. The Raman effect was first observed in 1928 by C.V. Raman and K.S. Krishnan [1], but wide application was delayed until the development of the laser. The nondestructive nature of the probe, flexibility in sampling arrangements, and a technical revolution [2, 3, 4, 5] in multi-channel detection and Rayleigh filters opened up many new areas where Raman measurements have proven to be very informative [6, 7]. Applications in the electronics and chemical industries are increasing and range from process control in semiconductor and polymer production to microanalysis of integrated circuits [8].
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Schulte, A., Guo, Y. (2006). LASER RAMAN SPECTROSCOPY. In: Vij, D. (eds) Handbook of Applied Solid State Spectroscopy. Springer, Boston, MA. https://doi.org/10.1007/0-387-37590-2_15
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DOI: https://doi.org/10.1007/0-387-37590-2_15
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