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Substrate temperature-dependent physical properties of nanocrystalline zirconium titanate thin films

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Abstract

Nanocrystalline zirconium titanate thin films were deposited by direct current magnetron reactive sputtering on to glass substrates at room temperature and at different substrate temperatures of 423, 473, 523, and 573 K under high vacuum conditions. The deposited films have been characterized to study the physical properties of the films as a function of substrate temperature. Though the film exhibited amorphous characteristics at room temperature the higher temperatures resulted in the evolution of crystallites in the films. The crystallinity increased with temperature from 423 K onwards and the film deposited at 523 K exhibited a high crystallite size of 22 nm. The SEM images of the films revealed the improvement in the crystallinity from 423 to 523 K with dense columnar structure normal to the substrate. Further higher treatment deteriorated the film properties. The films showed a good transmittance of above 80%. A high optical transmittance of 91% and a high packing density of 96% have been observed for the film deposited at 523 K. The thickness of the films remained consistent at ~230 nm (±6 nm). It is noticed that an increase in the substrate temperature enhanced the structural, optical, and electrical properties of the films up to 523 K.

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Acknowledgment

The author (DJR) acknowledges Department of Science and Technology (DST), New Delhi, for financial assistance under INSPIRE fellowship (IF120615).

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Authors and Affiliations

  1. Materials Research Laboratory, Department of Physics, Sri Krishnadevaraya University, Anantapuramu, AP, 515003, India

    D. Jhansi Rani, A. Guru Sampath Kumar & T. Subba Rao

  2. Department of Physics, Malla Reddy Engineering College (A), Secunderabad, Telangana, 500100, India

    A. Guru Sampath Kumar

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  1. D. Jhansi Rani
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Rani, D.J., Kumar, A.G.S. & Rao, T.S. Substrate temperature-dependent physical properties of nanocrystalline zirconium titanate thin films. J Coat Technol Res 14, 971–980 (2017). https://doi.org/10.1007/s11998-017-9951-4

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